AUTOMATED SYSTEMS AND METHODS FOR CHARACTERIZING LIGHT-EMITTING DEVICES
    1.
    发明申请
    AUTOMATED SYSTEMS AND METHODS FOR CHARACTERIZING LIGHT-EMITTING DEVICES 审中-公开
    用于表征发光装置的自动化系统和方法

    公开(公告)号:US20110184678A1

    公开(公告)日:2011-07-28

    申请号:US12874274

    申请日:2010-09-02

    Abstract: Automated systems and methods for characterizing light-emitting devices as a function of the electrical and temperature properties of the device are disclosed. The system includes a thermal stack assembly operatively connected to a temperature control system and that operably supports and controls the temperature of the light-emitting device. A power supply provides varying amounts of electrical power to the light-emitting device. A control computer controls the power supply and the temperature control system based on a user-defined electrical and temperature profiles. A light processor optically analyzes light from the light-emitting device as its electrical and temperature properties are varied. The control computer receives and processes electrical signals from the light processor and outputs one or more optical characterizations as a function of electrical and temperature properties of the light-emitting device.

    Abstract translation: 公开了用于表征作为设备的电气和温度特性的函数的发光器件的自动化系统和方法。 该系统包括可操作地连接到温度控制系统并且可操作地支撑和控制发光装置的温度的热堆叠组件。 电源为发光装置提供不同数量的电力。 控制计算机根据用户定义的电气和温度曲线控制电源和温度控制系统。 光处理器光学地分析来自发光器件的光,因为其电和温度特性是变化的。 控制计算机接收并处理来自光处理器的电信号,并且输出作为发光装置的电气和温度特性的函数的一个或多个光学表征。

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