公开(公告)号：US07437917B1

公开(公告)日：2008-10-21

申请号：US11420233

申请日：2006-05-25

申请人： Robert J. McNaughton ,  Mark Malburg

发明人： Robert J. McNaughton ,  Mark Malburg

IPC分类号： G01M19/00

CPC分类号： G01B5/0028 ,  G01B7/08

摘要： A method for determining local departures of opposed friction surfaces that are spaced apart in parallel planes normal to the axis of the rotor. Displacement sensing probes are placed in opposing alignment adjacent the friction surfaces and rotor is spun. Instantaneous distances from each probe to the friction surfaces is made by repetitively sampling and converting the sample distances into digital form. The differences between contemporaneous sample distances are computed to determine rotor thicknesses and displayed. An analog measure of the instantaneous angular rotor position is provided for each instantaneous angular position. The angular rotor position and distance measures are correlated and the angular rotor position sample converted to digital form. While the time interval between successive distance samples is constant the rotor angular velocity may vary during a revolution and spline-based interpolation between successive distance samples is performed to obtain to obtain a representation of equiangularly spaced sample values.

摘要翻译： 一种用于确定相对摩擦表面的局部偏离的方法，所述对置的摩擦表面在与转子的轴线垂直的平行平面中间隔开。 位移传感探针相对于摩擦表面相对配置，转子旋转。 通过重复采样和将采样距离转换为数字形式，可以实现从每个探头到摩擦表面的瞬时距离。 计算同期采样距离之间的差异，以确定转子厚度并显示。 为每个瞬时角位置提供瞬时角转子位置的模拟测量。 角转子位置和距离测量相关，角转子位置样本转换为数字形式。 虽然连续距离样本之间的时间间隔是恒定的，但转子角速度可以在旋转期间变化，并且执行连续距离样本之间的基于样条的插值以获得以获得等角度间隔的采样值的表示。

公开(公告)号：US20050049823A1

公开(公告)日：2005-03-03

申请号：US10711124

申请日：2004-08-25

申请人： Gregory Link ,  Raghunandan Sridhara ,  Youssef Hamidieh ,  Mark Malburg

发明人： Gregory Link ,  Raghunandan Sridhara ,  Youssef Hamidieh ,  Mark Malburg

IPC分类号： G01B21/30 ,  G01B13/16 ,  G01B15/04

CPC分类号： G01B21/30

摘要： A method for analyzing waviness of a surface. The method includes measuring a height of the surface, producing a set of data points indicative of a waviness profile, selecting a subset of the set of data points, calculating a waviness height of the subset, repeating the selecting, determining, and calculating steps for additional subsets until all members of the set of data points have been selected, and selecting a maximum waviness height value from the waviness heights calculated for each subset. The height of the surface may be measured over a distance longer than the length over which waviness assessment is required.

摘要翻译： 分析表面波纹的方法。 该方法包括测量表面的高度，产生指示波纹轮廓的一组数据点，选择该组数据点的子集，计算子集的波纹高度，重复选择，确定和计算步骤 直到数据点集合中的所有成员已被选择为止，并从为每个子集计算的波峰高度中选择最大波动高度值。 表面的高度可以在比要求波纹评估的长度更长的距离上测量。

公开(公告)号：US07035761B2

公开(公告)日：2006-04-25

申请号：US10711124

申请日：2004-08-25

申请人： Gregory Link ,  Raghunandan Sridhara ,  Youssef Hamidieh ,  Mark Malburg

发明人： Gregory Link ,  Raghunandan Sridhara ,  Youssef Hamidieh ,  Mark Malburg

IPC分类号： G01B13/16 ,  G01B11/06 ,  F02F3/00

CPC分类号： G01B21/30

摘要： A method for analyzing waviness of a surface. The method includes measuring a height of the surface, producing a set of data points indicative of a waviness profile, selecting a subset of the set of data points, calculating a waviness height of the subset, repeating the selecting, determining, and calculating steps for additional subsets until all members of the set of data points have been selected, and selecting a maximum waviness height value from the waviness heights calculated for each subset. The height of the surface may be measured over a distance longer than the length over which waviness assessment is required.

摘要翻译： 分析表面波纹的方法。 该方法包括测量表面的高度，产生指示波纹轮廓的一组数据点，选择该组数据点的子集，计算子集的波纹高度，重复选择，确定和计算步骤 直到数据点集合中的所有成员已被选择为止，并从为每个子集计算的波峰高度中选择最大波动高度值。 表面的高度可以在比要求波纹评估的长度更长的距离上测量。