公开(公告)号：US06356099B1

公开(公告)日：2002-03-12

申请号：US08337636

申请日：1994-11-10

申请人： Dennis Lee ,  Mark William Knecht ,  Kalaine Mak Wong ,  Oikwan Tsang

发明人： Dennis Lee ,  Mark William Knecht ,  Kalaine Mak Wong ,  Oikwan Tsang

IPC分类号： H03K1716

CPC分类号： H03K3/3565

摘要： An input buffer for an integrated circuit and providing reduced sensitivity to input noise present in a transmission line environment. This input buffer deskews an input signal where the rise time is much slower than the fall time, such as that from an open-collector output driver, so that the rising edge propagation delay and falling edge propagation delay of the input buffer are approximately equal.

摘要翻译： 用于集成电路的输入缓冲器，并且对传输线环境中存在的输入噪声提供降低的灵敏度。 该输入缓冲器对输入信号进行偏移，其中上升时间比下降时间慢得多，例如来自集电极开路输出驱动器的输入信号，使得输入缓冲器的上升沿传播延迟和下降沿传播延迟近似相等。

公开(公告)号：US06457152B1

公开(公告)日：2002-09-24

申请号：US09174250

申请日：1998-10-16

申请人： Daniel Noah Paley ,  Mark William Knecht

发明人： Daniel Noah Paley ,  Mark William Knecht

IPC分类号： G06F1324

CPC分类号： H04L43/50 ,  H04L29/06 ,  H04L69/03

摘要： A method of testing a device includes monitoring an output of the device, wherein the output is generated by the device in response to an applied test command; and resolving the output into atomic operations, wherein the atomic operations are substantially the smallest constituent operations which are substantially independent of the device. The method is used to provide a simple, comprehensive test environment that effectively tests 1394a and 1394-1995 designs, for example, in Verilog. The test environment contains rules which completely characterize the behavior of different 1394 bus protocols as defined by the IEEE specifications. The test environment provides portability between different devices under test and between different protocols, automated closed-loop reconciliation of test commands and protocol requirements, topology independence, and out-of-order execution of instructions or relative sequencing. The test environment further allows failure injection, and separate and independent design of the device and a test system.

摘要翻译： 测试设备的方法包括监视设备的输出，其中响应于所应用的测试命令，设备产生输出; 并将输出解析为原子操作，其中原子操作基本上是基本上独立于该装置的最小组成操作。 该方法用于提供一个简单，全面的测试环境，可有效测试1394a和1394-1995设计，例如Verilog。 测试环境包含完全表征IEEE规范定义的不同1394总线协议的行为的规则。 测试环境提供了不同测试设备之间以及不同协议之间的可移植性，测试命令和协议要求的自动闭环协调，拓扑独立性以及指令或相关排序的无序执行。 测试环境进一步允许故障注入，以及设备和测试系统的独立和独立设计。