公开(公告)号：US5726705A

公开(公告)日：1998-03-10

申请号：US770571

申请日：1996-12-19

申请人： Masanori Imanishi ,  Kiyoshi Yoshida ,  Teruo Asaeda ,  Yutaka Suzuki ,  Shigeru Chida ,  Masami Watanabe

发明人： Masanori Imanishi ,  Kiyoshi Yoshida ,  Teruo Asaeda ,  Yutaka Suzuki ,  Shigeru Chida ,  Masami Watanabe

IPC分类号： G01B11/30 ,  B05C11/00 ,  G01N21/84 ,  G01N21/88 ,  G01N21/93 ,  H04N7/18

CPC分类号： G01N21/8806

摘要： A surface defect inspection apparatus a lighting unit shaped in an arched form laid across the path of movement of an object under inspection for illuminating its surface. A light diffusion sheet is located between the lighting unit and the path of movement of the object for forming a bright and dark light pattern on the surface of the object. A plurality of light sensors are arranged in an arched form laid across the path of movement of the object. Each of the light sensors produces an electrical signal in response to light of reflection from the surface of the object. The electrical signal is converted into an image including the bright and dark light pattern. This conversion is repeated to produce similar images in sequence for inspection of a defect which may exist on the surface of the object.

摘要翻译： 一种表面缺陷检查装置，其形状为拱形，照射在被检查物体的运动路径上以照射其表面。 光漫射片位于照明单元和物体的移动路径之间，用于在物体的表面上形成明暗的光图案。 多个光传感器布置成横过物体运动路径的拱形形式。 每个光传感器响应于来自物体表面的反射光产生电信号。 电信号被转换为包括亮和暗光图案的图像。 重复该转换以依次产生类似的图像，以检查可能存在于物体表面上的缺陷。