Sub-wavelength structure layer, method for fabricating the same and photoelectric conversion device applying the same
    1.
    发明申请
    Sub-wavelength structure layer, method for fabricating the same and photoelectric conversion device applying the same 审中-公开
    亚波长结构层,其制造方法以及应用其的光电转换装置

    公开(公告)号:US20110146779A1

    公开(公告)日:2011-06-23

    申请号:US12659955

    申请日:2010-03-26

    摘要: The present invention relates to a method for fabricating a sub-wavelength structure layer, including: forming a metal film on a passivation layer, an n-GaN layer or a transparent conductive oxide layer; performing thermal treatment to form self assembled metal nano particles; using the metal nano particles as a mask to remove a partial area of the passivation layer, the n-GaN layer or the transparent conductive oxide layer to form a sub-wavelength structure of which the cross-sectional area increases along the thickness direction of the passivation layer, the n-GaN layer or the transparent conductive oxide layer; and removing the metal nano particles. In addition, the present invention further provides the obtained sub-wavelength structure layer and a photoelectric conversion device using the same.

    摘要翻译: 本发明涉及一种制造亚波长结构层的方法,包括:在钝化层,n-GaN层或透明导电氧化物层上形成金属膜; 进行热处理以形成自组装的金属纳米颗粒; 使用金属纳米颗粒作为掩模去除钝化层,n-GaN层或透明导电氧化物层的部分区域,以形成沿着厚度方向的横截面积增加的亚波长结构 钝化层,n-GaN层或透明导电氧化物层; 并去除金属纳米颗粒。 此外,本发明还提供所获得的亚波长结构层和使用其的光电转换装置。