公开(公告)号：US20160061861A1

公开(公告)日：2016-03-03

申请号：US14716344

申请日：2015-05-19

Applicant: Mi-so KIM ,  Jong-won HAN

Inventor： Mi-so KIM ,  Jong-won HAN

IPC: G01R1/04 ,  G01R31/28

CPC classification number: G01R1/0466 ,  G01R31/2863

Abstract: Provided are a test socket for a semiconductor device and a test device including the test socket. The test device includes a test socket including terminals arranged in a two-dimensional array and corresponding to terminals of the semiconductor device and a ground line extending along at least one row of two-dimensional array; and a substrate electrically connected to the test socket so as to transmit and receive a test signal. The test socket includes a ground line extending along at least one row of the two-dimensional array.

Abstract translation: 提供了一种用于半导体器件的测试插座和包括测试插座的测试装置。 测试装置包括测试插座，其包括以二维阵列布置并对应于半导体器件的端子的端子和沿着至少一行二维阵列延伸的接地线; 以及电连接到测试插座以便发送和接收测试信号的基板。 测试插座包括沿着至少一行二维阵列延伸的接地线。