公开(公告)号：US06421793B1

公开(公告)日：2002-07-16

申请号：US09359460

申请日：1999-07-22

申请人： Leland Lester ,  David Iglehart ,  Stephen J. Swain ,  Marco Becker ,  Charles W. Race, Jr. ,  Michael D. Perrine

发明人： Leland Lester ,  David Iglehart ,  Stephen J. Swain ,  Marco Becker ,  Charles W. Race, Jr. ,  Michael D. Perrine

IPC分类号： G06F1100

CPC分类号： G06F11/3664 ,  G06F11/2733 ,  G06F11/3692

摘要： A system and method are disclosed for automated testing of electronic devices. An original test is performed on a model product (24) while the model product (24) is coupled to a test recorder (12). During the test, the model product (24) is manipulated to invoke a desired response. As the test is performed, the manipulations and the desired responses are recorded by the test recorder (12) in an executable format (35). Subsequently, a test analyzer (12) is coupled to a to-be-tested product (24), and the executable recording (35) of the test is played such that the to-be-tested product (24) is manipulated as the model product (24) had been manipulated during the original test. The to-be-tested product's (24) responses to the manipulations are compared against the model product's responses (24). Any difference between the to-be-tested product's (24) responses and the model product's (24) responses are identified.

摘要翻译： 公开了一种用于电子设备的自动测试的系统和方法。 当模型产品（24）耦合到测试记录器（12）时，在模型产品（24）上执行原始测试。 在测试期间，操纵模型产品（24）以调用期望的响应。 当测试被执行时，操作和期望的响应由测试记录器（12）以可执行格式记录（35）。 随后，将测试分析器（12）耦合到被测试产品（24），并且播放测试的可执行记录（35），使得被测试产品（24）被操作为 模型产品（24）在原始测试期间被操纵。 将待测试产品（24）对操作的响应与模型产品的响应进行比较（24）。 确定待测试产品（24）响应和模型产品（24）响应之间的任何差异。