摘要:
A storage system with a data recovery function and its method reduce errors in a storage medium to a recoverable range of a general ECC function by repeating a testing and recovery procedure for one or more times to assure the accuracy of reading data and enhance the data reliability effectively. The data recovery procedure includes the steps of providing test data by a test data generator of the storage system, writing the test data into a memory block where error data is found, finding an error bit by reading the test data, reducing the error to a recoverable range of the ECC technique by the recovery procedure. If the error bit cannot be found or reduced to a recoverable range of the ECC technique within an upper limit of the number of tests, the memory block is marked as bad.
摘要:
A method for memory space management is disclosed. It uses a resident program loaded into an operation system or the controller of a storage device to monitor the storage space and the resource allocation of the file system of the storage device. The status of the logical address with an erased and invalid data mapped with a physical block is checked via a L2P mapping table. By using a data erase instruction, the controller modifies the L2P mapping table to cancel the link relation between the physical block and the logical address and erase the physical block to release the memory space. Finally, the check location is stored for a next check. The method for memory space management improves the access speed and the usage life of the storage device.
摘要:
An electronic storage device for connecting with a host system includes a flash memory including a number of memory segments, and a controller including an error correction segment capable of generating a first correction code and a second correction code according to a written data received by the controller. The written data, the first correction code and the second correction code are written into a memory segment of the flash memory by the controller. The first correction code is used for checking whether there is an error bit in the written data, and the second correction code is used for checking and correcting said error bit in the written data.
摘要:
A solid state semiconductor storage device with temperature control function comprises a non-volatile memory unit, a temperature sensing element, and a control unit. The temperature sensing element is used for sensing the operation temperature of the solid state semiconductor storage device so as to provide a temperature sensing signal to the control unit. According to the temperature sensing signal, the control unit controls the operation mode of the solid state semiconductor storage device for achieving the function of temperature control.
摘要:
A control method for the memory system is suitable for a memory system to process the user data from a host. The control unit divides the address of the storage space of the host into a plurality of logical segments for accessing data. The memory system provides a storage space with a plurality of physical segments to access data. The control method comprises the following steps. Firstly, a master table is provided in the physical memory for recording the mapping relation between the addresses of the logical units and the addresses of the physical units. When the data is written, the mapping relation between the addresses of the logical units and the addresses of the physical units is adjusted according to the wear of the physical units. Finally, the data is written into the physical segment according to the master table.
摘要:
A non-volatile memory of present invention includes a number of memory blocks and a static wear leveling device. The static wear leveling device includes a memory unit for storing the erase counts of the memory blocks and a controlling unit for getting the erase counts from the memory unit, and calculating the standard deviation based on the EC, and deciding the way of the static wear leveling cycle according to the standard deviation. The controlling unit deciding the way of the static wear leveling cycle include the steps of setting at least one predetermined threshold point and judging whether the standard deviation of the erase counts is smaller than the predetermined threshold point. If the standard deviation of the erase counts is smaller than the predetermined threshold point, the static wear leveling cycle starts for a first amount of cycles and moves the static data stored a first number of memory blocks. If the standard deviation of the erase counts is bigger than the predetermined threshold point, starts for a second amount of cycles and moves the static data stored a second number of memory blocks.
摘要:
A control method of a memory storage device for writing an updated data from a host to the memory storage device is provided. The memory storage device provides storage space which is divided into a plurality of physical blocks to access the updated data. The control method includes the following steps: first, determining whether the updated data is a hot data or not; finally, storing the less updated data which is not the hot data into the physical block which has the higher erase counts according to the result of above determination.
摘要:
The present invention discloses a control method of a multi-channel hybrid density memory storage device for access a user data. The storage device includes a plurality of low density memories (LDM) and high density memories (HDM). The steps of the method comprises: first, determining where the user data transmitted; then, using one of two error correction circuits which have different error correction capability to encode or decode the user data.
摘要:
A storage system with a data recovery function and its method reduce errors in a storage medium to a recoverable range of a general ECC function by repeating a testing and recovery procedure for one or more times to assure the accuracy of reading data and enhance the data reliability effectively. The data recovery procedure includes the steps of providing test data by a test data generator of the storage system, writing the test data into a memory block where error data is found, finding an error bit by reading the test data, reducing the error to a recoverable range of the ECC technique by the recovery procedure. If the error bit cannot be found or reduced to a recoverable range of the ECC technique within an upper limit of the number of tests, the memory block is marked as bad.
摘要:
A micro memory card includes a first housing having a first thickness and a first width; a first device connector formed on an end of the first housing, the first device connector conforming to a first device connection standard and allowing access to memory of the micro memory card by a device compatible with the first device connection standard; a second housing having a second thickness and a second width, the second housing being integrally joined with the first housing; and a second device connector formed on an end of the second housing at an opposite end of the micro memory card from the first device connector, the second device connector conforming to a second device connection standard and allowing access to memory of the micro memory card by a device compatible with the second device connection standard.