公开(公告)号：US06257761B1

公开(公告)日：2001-07-10

申请号：US09000785

申请日：1997-12-30

申请人： Yew Khoy Chuah ,  Ming-Tsun Sun ,  Bin-Juine Huang

发明人： Yew Khoy Chuah ,  Ming-Tsun Sun ,  Bin-Juine Huang

IPC分类号： G01N2520

CPC分类号： G01K17/20 ,  G01N25/18

摘要： This invention makes use of a electronically controlled heating device to form a region of constant high temperature on one side of the insulating material, and causes most of the heat transfer to concentrate in a longitudinal heat flux, which flows across the direction of the thickness of object-to-be-tested, to achieve the effect of one-dimensional heat transfer. When the temperatures on both sides of the insulation material being tested come to a stable state, the temperatures, the thickness of the material, and the heat flux, are measured and used to calculate the heat conductivity. The difference between the ideal two-dimensional heat transfer and the one-dimensional heat transfer can be corrected by the results of a theoretical model. The apparatus has been used to test a material with known heat conductivity. The result of the test conforms well with the expected value. Currently, the prototype which has been developed may be designed with a digital circuit which consists mainly of a single-chip microcomputer to perform PWM (Pulse Width Modulation) temperature control, temperature measurement, parameter input and coefficient calculation and displays functions.

摘要翻译： 本发明利用电子控制的加热装置在绝缘材料的一侧上形成恒定高温区域，并且使大多数热传递集中在纵向热通量中，该热通量横跨厚度方向 被测对象，实现一维传热的效果。 当待测绝缘材料两侧的温度达到稳定状态时，测量温度，材料厚度和热通量，并用于计算热导率。 通过理论模型的结果可以校正理想二维传热与一维传热之间的差异。 该设备已被用于测试具有已知导热性的材料。 测试结果与预期值吻合良好。 目前，已经开发的原型可以设计成具有主要由单片机执行PWM（脉宽调制）温度控制，温度测量，参数输入和系数计算和显示功能的数字电路。