公开(公告)号：US20060156149A1

公开(公告)日：2006-07-13

申请号：US11257401

申请日：2005-10-25

申请人： Andreas Logisch ,  Monica Martins ,  Bjorn Flach ,  Wolfgang Ruf ,  Martin Schnell ,  Ana Leao

发明人： Andreas Logisch ,  Monica Martins ,  Bjorn Flach ,  Wolfgang Ruf ,  Martin Schnell ,  Ana Leao

IPC分类号： G01R31/28 ,  G06F11/00

CPC分类号： G11C29/028 ,  G11C29/56

摘要： A tester for semiconductor components with a plurality of channels is connected to a specific semiconductor component in order to characterize the signal path between tester and semiconductor component under production conditions. The specific semiconductor component includes measuring units that are connected to connection contacts and in each case provide the functionality of a signal generator, a signal detector, a digital communication interface and a receiving unit for trigger signals. The specific semiconductor component further includes a trigger logic to convey trigger signals between the receiving unit of a first one and the signal generator or detector of a second one of the measuring units.

摘要翻译： 具有多个通道的半导体部件的测试器连接到特定的半导体部件，以便在生产条件下表征测试仪和半导体部件之间的信号路径。 特定的半导体部件包括连接到连接触点的测量单元，并且在每种情况下提供信号发生器，信号检测器，数字通信接口和用于触发信号的接收单元的功能。 特定半导体部件还包括用于在第一个的接收单元和第二个测量单元的信号发生器或检测器之间传送触发信号的触发逻辑。