公开(公告)号：US08508746B2

公开(公告)日：2013-08-13

申请号：US13072294

申请日：2011-03-25

申请人： Adam Wax ,  Yizheng Zhu ,  Natan Tzvi Shaked

发明人： Adam Wax ,  Yizheng Zhu ,  Natan Tzvi Shaked

IPC分类号： G01B9/021

CPC分类号： G01B9/02024 ,  G01B9/02047 ,  G01B9/02057

摘要： Disclosed herein are interferometric systems having reflective chambers and related methods. According to an aspect, an interferometric system may include a light source for generating an illumination beam that propagates towards a sample. A sample holder may hold the sample and include a partially reflective cover for allowing a first portion of the illumination beam to pass therethrough to interact with the sample to produce a sample beam that propagates substantially along an optical axis. The cover may be oriented at an angle for reflecting a second portion of the illumination beam to produce a reference beam that propagates at a predetermined angle with respect to the optical axis. An imaging module may redirect the reference beam towards the optical axis at a detection plane. A detector may intercept the sample and reference beams and may generate a holographic representation of the sample based on the beams.

摘要翻译： 本文公开了具有反射室和相关方法的干涉系统。 根据一个方面，干涉仪系统可以包括用于产生向样品传播的照明光束的光源。 样品保持器可以保持样品并且包括部分反射的盖，用于允许照明光束的第一部分通过其与样品相互作用以产生基本上沿着光轴传播的样品光束。 盖可以以一定角度定向以反射照明光束的第二部分，以产生相对于光轴以预定角度传播的参考光束。 成像模块可以将参考光束在检测平面处朝向光轴重定向。 检测器可以截取样本和参考光束，并可以基于光束产生样本的全息图。

公开(公告)号：US20110242543A1

公开(公告)日：2011-10-06

申请号：US13072294

申请日：2011-03-25

申请人： Adam Wax ,  Yizheng Zhu ,  Natan Tzvi Shaked

发明人： Adam Wax ,  Yizheng Zhu ,  Natan Tzvi Shaked

IPC分类号： G01B9/021

CPC分类号： G01B9/02024 ,  G01B9/02047 ,  G01B9/02057

摘要： Disclosed herein are interferometric systems having reflective chambers and related methods. According to an aspect, an interferometric system may include a light source for generating an illumination beam that propagates towards a sample. A sample holder may hold the sample and include a partially reflective cover for allowing a first portion of the illumination beam to pass therethrough to interact with the sample to produce a sample beam that propagates substantially along an optical axis. The cover may be oriented at an angle for reflecting a second portion of the illumination beam to produce a reference beam that propagates at a predetermined angle with respect to the optical axis. An imaging module may redirect the reference beam towards the optical axis at a detection plane. A detector may intercept the sample and reference beams and may generate a holographic representation of the sample based on the beams.

摘要翻译： 本文公开了具有反射室和相关方法的干涉系统。 根据一个方面，干涉仪系统可以包括用于产生向样品传播的照明光束的光源。 样品保持器可以保持样品并且包括部分反射的盖，用于允许照明光束的第一部分通过其与样品相互作用以产生基本上沿着光轴传播的样品光束。 盖可以以一定角度定向以反射照明光束的第二部分，以产生相对于光轴以预定角度传播的参考光束。 成像模块可以将参考光束在检测平面处朝向光轴重定向。 检测器可以截取样本和参考光束，并可以基于光束产生样本的全息图。