Test head docking system and method
    1.
    发明申请
    Test head docking system and method 有权
    测试头对接系统和方法

    公开(公告)号:US20070013405A1

    公开(公告)日:2007-01-18

    申请号:US11503226

    申请日:2006-08-11

    IPC分类号: G01R31/26

    CPC分类号: G01R31/2887 G01R31/2851

    摘要: A system for docking an electronic test head with a handling apparatus is provided. The system includes an assembly for at least partially aligning and subsequently bringing together the electronic test head and the handling apparatus. The system also includes a power driven actuator for providing only partially powered assistance in bringing together the electronic test head and the handling apparatus.

    摘要翻译: 提供了一种用于将电子测试头与处理装置对接的系统。 该系统包括用于使电子测试头和处理装置至少部分对准并随后将其组合在一起的组件。 该系统还包括一个动力驱动致动器,用于仅提供将电子测试头和处理装置组合在一起的部分动力辅助。