Method for testing and programming memory devices and system for same
    1.
    发明授权
    Method for testing and programming memory devices and system for same 有权
    用于测试和编程存储器件和系统的方法

    公开(公告)号:US07861059B2

    公开(公告)日:2010-12-28

    申请号:US11051325

    申请日:2005-02-03

    IPC分类号: G06F12/00 G06F13/00 G06F13/28

    摘要: A method and system are provided for programming a plurality of memory devices arranged in parallel. In one embodiment of the present invention, the plurality of memory devices comprises first and second memory devices, and the method comprises providing successively the first address to the first memory device and the second address to the second memory device. The first address refers to a first group of storage locations in the first memory device and the second address refers to a second group of storage locations in the second memory device. The method then proceeds to load in parallel a string of data to the first and second memory devices so that the string of data is written simultaneously to the first group of storage locations in the first memory device and to the second group of storage locations in the second memory device.

    摘要翻译: 提供了一种方法和系统,用于对并行布置的多个存储器件进行编程。 在本发明的一个实施例中,多个存储器件包括第一和第二存储器件,并且该方法包括连续提供第一地址到第一存储器件,第二地址提供给第二存储器件。 第一地址是指第一存储设备中的第一组存储位置,第二地址是指第二存储设备中的第二组存储位置。 然后,该方法继续并行地将一串数据加载到第一和第二存储器设备,使得数据串被同时写入第一存储器设备中的第一组存储位置和第二组存储位置 第二存储设备。