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1.发明授权Methods of making an article of semiconducting material on a mold comprising particles of a semiconducting material 失效在包含半导体材料颗粒的模具上制造半导体材料制品的方法公开(公告)号：US08540920B2
公开(公告)日：2013-09-24
申请号：US12466104
申请日：2009-05-14
Applicant: Prantik Mazumder , Sergey Potapenko , Natesan Venkataraman
Inventor： Prantik Mazumder , Sergey Potapenko , Natesan Venkataraman
CPC classification number: C30B28/04 , C30B15/007 , C30B28/10 , C30B29/06
Abstract: The invention relates to methods of making articles of semiconducting material and semiconducting material articles formed thereby, such as articles of semiconducting material that may be useful in making photovoltaic cells.
Abstract translation: 本发明涉及制造由此形成的半导体材料制品和半导体材料制品的方法，例如可用于制造光伏电池的半导体材料制品。
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2.发明申请METHODS OF MAKING AN UNSUPPORTED ARTICLE OF A SEMICONDUCTING MATERIAL USING THERMALLY ACTIVE MOLDS 审中-公开使用热活性物质制造半导体材料的不相关物品的方法公开(公告)号：US20120129293A1
公开(公告)日：2012-05-24
申请号：US13300829
申请日：2011-11-21
Applicant: Sergey Potapenko , Balram Suman , Lili Tian , Alex Usenko
Inventor： Sergey Potapenko , Balram Suman , Lili Tian , Alex Usenko
CPC classification number: C30B11/002 , C30B29/06 , H01L31/182 , Y02E10/546 , Y02P70/521
Abstract: The invention relates to methods of making unsupported articles of semiconducting material using thermally active molds having an external surface temperature, Tsurface, and a core temperature, Tcore, whererin Tsurface>Tcore.
Abstract translation: 本发明涉及使用具有外表面温度Tsurface和核心温度Tcore，其中T表面> Tcore的热活性模具制造无支撑物品的半导体材料的方法。
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3.发明申请公开(公告)号：US20120127487A1
公开(公告)日：2012-05-24
申请号：US12949307
申请日：2010-11-18
Applicant: Sergey Potapenko
Inventor： Sergey Potapenko
IPC: G01B11/06
CPC classification number: G01B11/0691
Abstract: Methods and apparatuses for determining a thickness of a glass substrate are disclosed. The method includes conveying the glass substrate past an optical measurement head and determining a measurement separation distance dm between a first surface plane of the glass substrate and the optical measurement head. A position of the optical measurement head relative to the first surface plane of the glass substrate is adjusted based on the measurement separation distance dm between the first surface plane of the glass substrate and the optical measurement head such that the glass substrate is within a working range of the optical measurement head as the glass substrate is conveyed past the optical measurement head. A thickness Tm of the glass substrate is measured with the optical measurement head as the glass substrate is conveyed past the optical measurement head.
Abstract translation: 公开了用于确定玻璃基板的厚度的方法和装置。 该方法包括将玻璃基板输送通过光学测量头，并确定玻璃基板的第一表面与光学测量头之间的测量间隔距离dm。 基于玻璃基板的第一表面和光学测量头之间的测量间隔距离dm来调节光学测量头相对于玻璃基板的第一表面平面的位置，使得玻璃基板处于工作范围内 作为玻璃基板的光学测量头被传送通过光学测量头。 当玻璃基板被输送通过光学测量头时，用光学测量头测量玻璃基板的厚度Tm。
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4.发明申请Method and System for Measuring Relative Positions Of A Specular Reflection Surface 审中-公开用于测量镜面反射表面的相对位置的方法和系统公开(公告)号：US20100277748A1
公开(公告)日：2010-11-04
申请号：US12433257
申请日：2009-04-30
Applicant: Sergey Potapenko
Inventor： Sergey Potapenko
IPC: G01B11/14
CPC classification number: G01B11/026 , G01C3/085 , G01S17/48
Abstract: A method for measuring relative positions of a specular reflective surface of an object along a measurement line is provided. The method includes converging at least one converging light beam at a nominal position on the measurement line and forming a reflected beam from the specular reflection surface. An image of the reflected beam is recorded at a detector plane. A position of the image of the reflected beam on the detector plane is determined and converted to a displacement of the specular reflection surface from the nominal position along the measurement line. A system for carrying out the method is also provided.
Abstract translation: 提供了一种用于测量沿着测量线的物体的镜面反射表面的相对位置的方法。 该方法包括将至少一个会聚光束会聚在测量线上的标称位置，并从镜面反射表面形成反射光束。 反射光束的图像被记录在检测器平面上。 确定反射光束在检测器平面上的图像的位置，并将其转换为沿着测量线的标称位置的镜面反射表面的位移。 还提供了一种用于执行该方法的系统。
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Patent Agency Ranking
公开(公告)号：US08441532B2
公开(公告)日：2013-05-14
申请号：US12391585
申请日：2009-02-24
Applicant: Sergey Potapenko
Inventor： Sergey Potapenko
IPC: H04N7/18
CPC classification number: H04N7/18 , C03B17/064 , G01B11/2513
Abstract: A method of measuring a shape of a specular reflective surface is provided. A pattern displayed on a surface of a target positioned at a target plane is produced from a specular reflective surface positioned at a measurement plane. An image of the reflection is recorded at an imaging plane. Positions of a plurality of points on the specular reflective surface relative to the imaging plane are determined. A first relation between feature positions on the image of the reflection and feature positions on the pattern is determined. The shape of the specular reflective surface is determined from a second relation involving a surface profile of the specular reflective surface and the first relation using the positions of the plurality of points as an initial condition.
Abstract translation: 提供了一种测量镜面反射表面的形状的方法。 从位于测量平面处的镜面反射表面产生显示在位于目标平面上的目标表面上的图案。 在成像平面上记录反射的图像。 确定镜面反射表面上相对于成像平面的多个点的位置。 确定图案上的反射和特征位置的图像上的特征位置之间的第一关系。 镜面反射表面的形状由涉及镜面反射表面的表面轮廓的第二关系和使用多个点的位置作为初始条件的第一关系确定。
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公开(公告)号：US20130070087A1
公开(公告)日：2013-03-21
申请号：US13661469
申请日：2012-10-26
Applicant: Sergey Potapenko
Inventor： Sergey Potapenko
IPC: H04N7/18
CPC classification number: H04N7/18 , C03B17/064 , G01B11/2513
Abstract: A method of measuring a shape of a specular reflective surface is provided. A pattern displayed on a surface of a target positioned at a target plane is produced from a specular reflective surface positioned at a measurement plane. An image of the reflection is recorded at an imaging plane. Positions of a plurality of points on the specular reflective surface relative to the imaging plane are determined. A first relation between feature positions on the image of the reflection and feature positions on the pattern is determined. The shape of the specular reflective surface is determined from a second relation involving a surface profile of the specular reflective surface and the first relation using the positions of the plurality of points as an initial condition.
Abstract translation: 提供了一种测量镜面反射表面的形状的方法。 从位于测量平面处的镜面反射表面产生显示在位于目标平面上的目标表面上的图案。 在成像平面上记录反射的图像。 确定镜面反射表面上相对于成像平面的多个点的位置。 确定图案上的反射和特征位置的图像上的特征位置之间的第一关系。 镜面反射表面的形状由涉及镜面反射表面的表面轮廓的第二关系和使用多个点的位置作为初始条件的第一关系确定。
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7.发明申请公开(公告)号：US20100291380A1
公开(公告)日：2010-11-18
申请号：US12466104
申请日：2009-05-14
Applicant: Prantik Mazumder , Sergey Potapenko , Natesan Venkataraman
Inventor： Prantik Mazumder , Sergey Potapenko , Natesan Venkataraman
CPC classification number: C30B28/04 , C30B15/007 , C30B28/10 , C30B29/06
Abstract: The invention relates to methods of making articles of semiconducting material and semiconducting material articles formed thereby, such as articles of semiconducting material that may be useful in making photovoltaic cells.
Abstract translation: 本发明涉及制造由此形成的半导体材料制品和半导体材料制品的方法，例如可用于制造光伏电池的半导体材料制品。
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公开(公告)号：US20100214406A1
公开(公告)日：2010-08-26
申请号：US12391585
申请日：2009-02-24
Applicant: Sergey Potapenko
Inventor： Sergey Potapenko
CPC classification number: H04N7/18 , C03B17/064 , G01B11/2513
Abstract: A method of measuring a shape of a specular reflective surface is provided. A pattern displayed on a surface of a target positioned at a target plane is produced from a specular reflective surface positioned at a measurement plane. An image of the reflection is recorded at an imaging plane. Positions of a plurality of points on the specular reflective surface relative to the imaging plane are determined. A first relation between feature positions on the image of the reflection and feature positions on the pattern is determined. The shape of the specular reflective surface is determined from a second relation involving a surface profile of the specular reflective surface and the first relation using the positions of the plurality of points as an initial condition.
Abstract translation: 提供了一种测量镜面反射表面的形状的方法。 从位于测量平面处的镜面反射表面产生显示在位于目标平面上的目标表面上的图案。 在成像平面上记录反射的图像。 确定镜面反射表面上相对于成像平面的多个点的位置。 确定图案上的反射和特征位置的图像上的特征位置之间的第一关系。 镜面反射表面的形状由涉及镜面反射表面的表面轮廓的第二关系和使用多个点的位置作为初始条件的第一关系确定。
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9.发明申请Inspection system and method for identifying surface and body defects in a glass sheet 审中-公开用于识别玻璃板表面和身体缺陷的检查系统和方法公开(公告)号：US20060092276A1
公开(公告)日：2006-05-04
申请号：US10977514
申请日：2004-10-28
Applicant: James Ariglio , Ted Brownlee , David Darrow , Vincent Howell , Sergey Potapenko , Patrick Sullivan , Peter Voit
Inventor： James Ariglio , Ted Brownlee , David Darrow , Vincent Howell , Sergey Potapenko , Patrick Sullivan , Peter Voit
CPC classification number: G01N21/896 , G01N2021/9513
Abstract: An inspection system and method are described herein which use an illuminating system (e.g., light source (strobe) and light sharpening components) and an imaging system (e.g., digital camera and computer/software) to inspect and identify surface and body defects in a glass sheet (e.g., liquid crystal display (LCD) glass substrate).
Abstract translation: 本文描述了使用照明系统（例如，光源（闪光灯）和光锐化组件）和成像系统（例如，数码相机和计算机/软件）来检查和识别表面和身体缺陷的检查系统和方法 玻璃板（例如液晶显示器（LCD）玻璃基板）。
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