Method for forming buffer layer for GaN single crystal
    1.
    发明授权
    Method for forming buffer layer for GaN single crystal 失效
    GaN单晶缓冲层形成方法

    公开(公告)号:US08383494B2

    公开(公告)日:2013-02-26

    申请号:US12433949

    申请日:2009-05-01

    IPC分类号: H01L21/36 C30B23/00 C30B29/38

    CPC分类号: C30B29/406 C30B25/02

    摘要: Disclosed is a method for forming a buffer layer for growing gallium nitride single crystals on a sapphire substrate using hydride vapor phase epitaxy (HVPE), wherein the buffer layer is formed in the form of a doped vertical gallium nitride (GaN) single crystal film with a nanoporosity of 0.10 to 0.15 μm on the sapphire substrate by reacting HCl and NH3 as a Group III/V mix gas.The nanoporous buffer layer interposed on the interface between the sapphire substrate and gallium nitride reduces tensile stress generated by the difference in thermal expansion coefficient between gallium nitride and the sapphire substrate, enables growth of the gallium nitride layer to a thickness of 1 micrometer (μm) to several millimeters (mm) without causing cracks, and reduces the lattice constant difference to improve crystallinity.

    摘要翻译: 公开了一种使用氢化物​​气相外延(HVPE)在蓝宝石衬底上形成用于生长氮化镓单晶的缓冲层的方法,其中缓冲层以掺杂的垂直氮化镓(GaN)单晶膜的形式形成,具有 通过HCl和NH 3作为III / V族混合气体反应,在蓝宝石衬底上的0.10〜0.15μm的纳米孔隙度。 插入在蓝宝石衬底和氮化镓之间的界面上的纳米多孔缓冲层降低由氮化镓和蓝宝石衬底之间的热膨胀系数差产生的拉伸应力,能够使氮化镓层生长至1微米(μm) 至几毫米(mm)而不引起裂纹,并且减小晶格常数差异以改善结晶度。

    METHOD FOR FORMING BUFFER LAYER FOR GaN SINGLE CRYSTAL
    2.
    发明申请
    METHOD FOR FORMING BUFFER LAYER FOR GaN SINGLE CRYSTAL 失效
    用于形成GaN单晶的缓冲层的方法

    公开(公告)号:US20090275190A1

    公开(公告)日:2009-11-05

    申请号:US12433949

    申请日:2009-05-01

    IPC分类号: H01L21/20

    CPC分类号: C30B29/406 C30B25/02

    摘要: Disclosed is a method for forming a buffer layer for growing gallium nitride single crystals on a sapphire substrate using hydride vapor phase epitaxy (HVPE), wherein the buffer layer is formed in the form of a doped vertical gallium nitride (GaN) single crystal film with a nanoporosity of 0.10 to 0.15 μm on the sapphire substrate by reacting HCl and NH3 as a Group III/V mix gas.The nanoporous buffer layer interposed on the interface between the sapphire substrate and galluim nitride reduces tensile stress generated by the difference in thermal expansion coefficient between gallium nitride and the sapphire substrate, enables growth of the gallium nitride layer to a thickness of 1 micrometer (m) to several millimeters (nm) without causing cracks, and reduces the lattice constant difference to improve crystallinity.

    摘要翻译: 公开了一种使用氢化物​​气相外延(HVPE)在蓝宝石衬底上形成用于生长氮化镓单晶的缓冲层的方法,其中缓冲层以掺杂的垂直氮化镓(GaN)单晶膜的形式形成,具有 通过HCl和NH 3作为III / V族混合气体,使蓝宝石衬底上的纳米孔隙率为0.10至0.15微米。 插入在蓝宝石衬底和伽利略氮化物之间的界面上的纳米多孔缓冲层降低了由氮化镓和蓝宝石衬底之间的热膨胀系数的差异产生的拉伸应力,能够使氮化镓层生长至1微米(μm) 到几毫米(nm)而不引起裂纹,并且减小了晶格常数差以改善结晶度。