公开(公告)号：US06429966B1

公开(公告)日：2002-08-06

申请号：US09572577

申请日：2000-05-17

Applicant: Neville Hazell ,  Shan Xue-Kang ,  Derek Willetts

Inventor： Neville Hazell ,  Shan Xue-Kang ,  Derek Willetts

IPC: H01S300

CPC classification number: H04B10/2942 ,  H01S3/06758 ,  H01S3/1301 ,  H01S3/2375 ,  H01S3/302 ,  H01S2301/04 ,  H04B10/2916

Abstract: The present invention provides an optical amplifier for a wavelength division multiplexed communication system, including a first amplifier stage responsive to changes in gain to cause a wavelength dependent gain tilt in one direction. a second amplifier stage (3) responsive to corresponding changes in gain to cause a wavelength dependent gain tilt in an opposite direction and gain control means (4) for controlling the gain of the first (2) and second (3) amplifier stages to maintain a substantially flat response for the amplifier (1) over time, in which the first amplifier stage (2) is a length of optical transmission fibre providing a Raman amplifier. The present invention provides an optical amplifier which uses dynamic gain tilt adjustment whilst maintaining a constant output level from the amplifier.

Abstract translation: 本发明提供了一种用于波分复用通信系统的光放大器，包括响应于增益变化的第一放大器级，以在一个方向上引起与波长相关的增益倾斜。 第二放大器级（3）响应于增益的相应变化而引起相反方向上的波长相关增益倾斜;以及增益控制装置（4），用于控制第一（2）和第二（3）放大器级的增益以维持 对于放大器（1）随时间推移的基本平坦的响应，其中第一放大器级（2）是提供拉曼放大器的光传输光纤的长度。 本发明提供一种使用动态增益倾斜调整同时保持来自放大器的恒定输出电平的光放大器。

公开(公告)号：US09208552B2

公开(公告)日：2015-12-08

申请号：US13814535

申请日：2012-04-23

Applicant: Carl Hess ,  John D. Miller ,  Shan Xue ,  Patrick LoPresti

Inventor： Carl Hess ,  John D. Miller ,  Shan Xue ,  Patrick LoPresti

IPC: G06K9/00 ,  G06T7/00

CPC classification number: G06T7/0004 ,  G06T7/001 ,  G06T2207/20012 ,  G06T2207/30148

Abstract: A semiconductor inspection apparatus performs a hybrid inspection process including cell-to-cell inspection, die-to-die inspection and die-to-golden or die-to-database inspection. The apparatus creates a golden image of a reticle complimentary to portions of the reticle that can be inspected by cell-to-cell inspection or die-to-die inspection. Alternatively, the apparatus creates a reduced database complimentary to portions of the reticle that can be inspected by cell-to-cell inspection or die-to-die inspection.

Abstract translation: 半导体检查装置进行包括电池到电池检查，管芯到管芯检查以及管芯到金属或管芯到数据库检查的混合检查过程。 该装置产生与通过电池到电池检查或模 - 模检查可以检查的掩模版的部分互补的掩模版的金色图像。 或者，该装置创建减少的数据库，其与通过电池到电池检查或管芯到管芯检查可以检查的掩模版的部分互补。

公开(公告)号：US20130279792A1

公开(公告)日：2013-10-24

申请号：US13814535

申请日：2012-04-23

Applicant: Carl Hess ,  John D. Miller ,  Shan Xue ,  Patrick LoPresti

Inventor： Carl Hess ,  John D. Miller ,  Shan Xue ,  Patrick LoPresti

IPC: G06T7/00

CPC classification number: G06T7/0004 ,  G06T7/001 ,  G06T2207/20012 ,  G06T2207/30148

Abstract: A semiconductor inspection apparatus performs a hybrid inspection process including cell-to-cell inspection, die-to-die inspection and die-to-golden or die-to-database inspection. The apparatus creates a golden image of a reticle complimentary to portions of the reticle that can be inspected by cell-to-cell inspection or die-to-die inspection. Alternatively, the apparatus creates a reduced database complimentary to portions of the reticle that can be inspected by cell-to-cell inspection or die-to-die inspection.

Abstract translation: 半导体检查装置进行包括电池到电池检查，管芯到管芯检查以及管芯到金属或管芯到数据库检查的混合检查过程。 该装置产生与通过电池到电池检查或模 - 模检查可以检查的掩模版的部分互补的掩模版的金色图像。 或者，该装置创建减少的数据库，其与通过电池到电池检查或管芯到管芯检查可以检查的掩模版的部分互补。