Enhanced debugging for embedded devices
    1.
    发明授权
    Enhanced debugging for embedded devices 有权
    增强嵌入式设备的调试

    公开(公告)号:US09158661B2

    公开(公告)日:2015-10-13

    申请号:US13620133

    申请日:2012-09-14

    IPC分类号: G06F11/00 G06F11/36

    CPC分类号: G06F11/3648

    摘要: Methods, machine-readable tangible storage media, and data processing systems that enable a debug host device to acquire memory dump information from a debug target device after the target device suffers an unrecoverable system malfunction are disclosed. In one embodiment, data in the volatile memory on a debug target device is accessed via a hardware integrated debug framework, which is also used to access data on a nonvolatile electronically erasable semiconductor memory of a debug target device, and one or more registers of one or more processors on a debug target device, and a core dump is created on the debug host device.

    摘要翻译: 公开了在目标设备遭受不可恢复的系统故障之后,使得调试主机设备能够从调试目标设备获取存储器转储信息的方法,机器可读有形存储介质和数据处理系统。 在一个实施例中,调试目标设备上的易失性存储器中的数据经由硬件集成调试框架访问,硬件集成调试框架也用于访问调试目标设备的非易失性电可擦除半导体存储器上的数据,以及一个或多个寄存器 或调试目标设备上的更多处理器,并且在调试主机设备上创建核心转储。

    ENHANCED DEBUGGING FOR EMBEDDED DEVICES
    3.
    发明申请
    ENHANCED DEBUGGING FOR EMBEDDED DEVICES 有权
    嵌入式设备的增强调试

    公开(公告)号:US20130212425A1

    公开(公告)日:2013-08-15

    申请号:US13620133

    申请日:2012-09-14

    IPC分类号: G06F11/20

    CPC分类号: G06F11/3648

    摘要: Methods, machine-readable tangible storage media, and data processing systems that enable a debug host device to acquire memory dump information from a debug target device after the target device suffers an unrecoverable system malfunction are disclosed. In one embodiment, data in the volatile memory on a debug target device is accessed via a hardware integrated debug framework, which is also used to access data on a nonvolatile electronically erasable semiconductor memory of a debug target device, and one or more registers of one or more processors on a debug target device, and a core dump is created on the debug host device.

    摘要翻译: 公开了在目标设备遭受不可恢复的系统故障之后,使得调试主机设备能够从调试目标设备获取存储器转储信息的方法,机器可读有形存储介质和数据处理系统。 在一个实施例中,调试目标设备上的易失性存储器中的数据经由硬件集成调试框架访问,硬件集成调试框架也用于访问调试目标设备的非易失性电可擦除半导体存储器上的数据,以及一个或多个寄存器 或调试目标设备上的更多处理器,并且在调试主机设备上创建核心转储。