公开(公告)号：US5989108A

公开(公告)日：1999-11-23

申请号：US924532

申请日：1997-09-05

申请人： Junzo Ikeda ,  Toshio Ishii ,  Shizuki Sasakura ,  Yasuo Yoshimura ,  Koichi Ueda

发明人： Junzo Ikeda ,  Toshio Ishii ,  Shizuki Sasakura ,  Yasuo Yoshimura ,  Koichi Ueda

IPC分类号： B24B7/17 ,  B24B7/22

CPC分类号： B24B7/17 ,  B24B7/228

摘要： A double side grinding apparatus for thin disklike work comprises a pair of rotatable grinding wheels having opposed circular grinding faces provided by respective end faces and so arranged as to be movable relative to each other axially thereof, and work rotating means for rotating the thin disklike work about its own axis while supporting the work in a grinding position between the grinding faces so that opposite surfaces of the work to be worked on face the respective grinding faces of the pair of the wheels, with an outer periphery of the work intersecting an outer periphery of each grinding face and with the center of the work positioned inwardly of the grinding faces.

摘要翻译： 一种用于薄盘状工作的双面研磨装置包括一对可旋转的砂轮，其具有由相应的端面设置的相对的圆形磨削面，并且被布置为可相对于其轴向移动;以及工作旋转装置，用于旋转薄盘状工件 围绕其自身的轴线，同时在磨削面之间的研磨位置支撑工件，使得待加工的工件的相对表面面对一对车轮的各个磨削面，工件的外周与外周面相交 并且工件的中心位于研磨面的内侧。

公开(公告)号：US5557402A

公开(公告)日：1996-09-17

申请号：US425497

申请日：1995-04-20

申请人： Toshihiro Osawa ,  Shizuki Sasakura ,  Haruhiko Terauchi

发明人： Toshihiro Osawa ,  Shizuki Sasakura ,  Haruhiko Terauchi

IPC分类号： G01B11/30 ,  G01N21/88 ,  G01N21/89 ,  G01N21/94 ,  G01N21/952 ,  G01N21/48

CPC分类号： G01N21/89 ,  G01N21/952

摘要： A surface flaw detecting apparatus of workpiece fast in flaw detecting speed, significantly shortened in the line cycle time, and simple and inexpensive in structure. By means of a control device, while a work rotating device is rotating a work about its axial line, a cleaning device remove soiling from the surface of the work, and its surface is illuminated by a lighting device, and its reflected light is detected by a line sensor camera, and presence or absence of flaw on the work surface is judged by a judging device from the result of detection. This series of measuring operation is done while the work makes a full revolution about its axial line, and hence as compared with other optical measurement, the measuring time may be shortened remarkably.

摘要翻译： 瑕疵检测速度快的工件表面缺陷检测装置，线周期时间显着缩短，结构简单，成本低廉。 通过控制装置，当工件旋转装置围绕其轴线旋转工件时，清洁装置从工件的表面去除污垢，并且其表面被照明装置照射，并且其反射光由 线传感器摄像机，以及根据检测结果由判断装置判断工作面上是否存在缺陷。 这一系列的测量操作是在其轴线全面旋转的情况下进行的，因此与其他光学测量相比，可以显着缩短测量时间。