公开(公告)号：US5557402A

公开(公告)日：1996-09-17

申请号：US425497

申请日：1995-04-20

申请人： Toshihiro Osawa ,  Shizuki Sasakura ,  Haruhiko Terauchi

发明人： Toshihiro Osawa ,  Shizuki Sasakura ,  Haruhiko Terauchi

IPC分类号： G01B11/30 ,  G01N21/88 ,  G01N21/89 ,  G01N21/94 ,  G01N21/952 ,  G01N21/48

CPC分类号： G01N21/89 ,  G01N21/952

摘要： A surface flaw detecting apparatus of workpiece fast in flaw detecting speed, significantly shortened in the line cycle time, and simple and inexpensive in structure. By means of a control device, while a work rotating device is rotating a work about its axial line, a cleaning device remove soiling from the surface of the work, and its surface is illuminated by a lighting device, and its reflected light is detected by a line sensor camera, and presence or absence of flaw on the work surface is judged by a judging device from the result of detection. This series of measuring operation is done while the work makes a full revolution about its axial line, and hence as compared with other optical measurement, the measuring time may be shortened remarkably.

摘要翻译： 瑕疵检测速度快的工件表面缺陷检测装置，线周期时间显着缩短，结构简单，成本低廉。 通过控制装置，当工件旋转装置围绕其轴线旋转工件时，清洁装置从工件的表面去除污垢，并且其表面被照明装置照射，并且其反射光由 线传感器摄像机，以及根据检测结果由判断装置判断工作面上是否存在缺陷。 这一系列的测量操作是在其轴线全面旋转的情况下进行的，因此与其他光学测量相比，可以显着缩短测量时间。