Measuring head system for a coordinate measuring machine and method for optically measuring of displacements of a probe element
    1.
    发明授权
    Measuring head system for a coordinate measuring machine and method for optically measuring of displacements of a probe element 有权
    用于坐标测量机的测量头系统和用于光学测量探针元件的位移的方法

    公开(公告)号:US08294906B2

    公开(公告)日:2012-10-23

    申请号:US12741075

    申请日:2008-10-29

    IPC分类号: G01B11/14

    CPC分类号: G01B11/007 G01B5/012

    摘要: A measuring head system for a coordinate measuring machine, having a scanning element for contacting a measured object as a contacting part, which can be moved such that an object to be measured can be mechanically scanned using the scanning element. An optical sensor is fixed on the measuring head base. Means are provided to generate a projection on the sensor line using at least one radiation source. The means have at least one first mask element to generate a first partial projection on the sensor line such that said partial projection is optimized to determine an x displacement and a y displacement of the contacting part in relation to the measuring head base in the x direction or y direction. An analysis unit is configured to determine the x displacement and the y displacement from signals only generated by the one sensor line.

    摘要翻译: 一种用于坐标测量机的测量头系统,具有用于接触作为接触部分的测量对象的扫描元件,其可被移动,使得可以使用扫描元件机械地扫描被测量物体。 光学传感器固定在测量头基座上。 提供装置以使用至少一个辐射源在传感器线路上产生投影。 所述装置具有至少一个第一掩模元件以在所述传感器线上产生第一部分投影,使得所述部分投影被优化以确定所述接触部分相对于所述测量头基座在x方向上的位移和位移,或 y方向。 分析单元被配置为从仅由一个传感器线产生的信号确定x位移和y位移。

    MEASURING HEAD SYSTEM FOR A COORDINATE MEASURING MACHINE AND METHOD FOR OPTICALLY MEASURING OF DISPLACEMENTS OF A PROBE ELEMENT
    2.
    发明申请
    MEASURING HEAD SYSTEM FOR A COORDINATE MEASURING MACHINE AND METHOD FOR OPTICALLY MEASURING OF DISPLACEMENTS OF A PROBE ELEMENT 有权
    用于坐标测量机的测量头系统和用于光学测量探头元件位移的方法

    公开(公告)号:US20110013199A1

    公开(公告)日:2011-01-20

    申请号:US12741075

    申请日:2008-10-29

    IPC分类号: G01B11/14

    CPC分类号: G01B11/007 G01B5/012

    摘要: The invention relates to a measuring head system (1) for a coordinate measuring machine, having a scanning element (6), which has a part provided for contacting a measured object as a contacting part (5), which can be moved in relation to a fixed measuring head base (2) in a lateral x direction (20) and a lateral y direction (21), such that an object to be measured can be mechanically scanned using the scanning element (6). An optical sensor (10), having a sensor line (11) which can be read out and comprises a plurality of array sensor elements, is fixed on the measuring head base (2). Furthermore, means are provided, which are particularly disposed spatially fixed to the contacting part (5), generate a projection—as a function of displacements of the contacting part (5) in relation to the measuring head base (2)—on the sensor line (11) using at least one radiation source (15). In addition, an analysis unit is provided. The means have at least one first mask element (17), which is implemented to generate a first partial projection on the sensor line (11) such that said partial projection is optimized to determine an x displacement and a y displacement of the contacting part (5) in relation to the measuring head base (2) in the x direction or y direction. The analysis unit is configured to determine the x displacement and the y displacement from signals only generated by the one sensor line (11).

    摘要翻译: 本发明涉及一种用于坐标测量机的测量头系统(1),其具有扫描元件(6),该扫描元件(6)具有用于接触作为接触部分(5)的测量对象的部分,所述接触部分可相对于 在横向x方向(20)和横向y方向(21)上的固定的测量头基座(2),使得可以使用扫描元件(6)机械地扫描被测量物体。 具有可读出并包括多个阵列传感器元件的传感器线(11)的光学传感器(10)固定在测量头基座(2)上。 此外,提供了特别设置在空间上固定到接触部分(5)的装置,产生作为接触部分(5)相对于测量头基座(2)的位移的函数的投影 - 在传感器 (11)使用至少一个辐射源(15)。 另外,提供分析单元。 所述装置具有至少一个第一掩模元件(17),其被实施为在传感器线(11)上产生第一部分投影,使得所述部分投影被优化以确定接触部分(5)的x位移和位移 )相对于测量头基座(2)在x方向或y方向上。 分析单元被配置为确定仅由一个传感器线(11)产生的信号的x位移和y位移。