公开(公告)号：US09310429B2

公开(公告)日：2016-04-12

申请号：US13462964

申请日：2012-05-03

申请人： Stephen Bradley Ippolito ,  Alan J. Weger

发明人： Stephen Bradley Ippolito ,  Alan J. Weger

IPC分类号： G01R31/00 ,  G01R31/311

CPC分类号： G01R31/311

摘要： A semiconductor wafer resting on a contact element has a spatially distributed force applied to its frontside and an equal and opposing force applied to its backside. The contact element comprises a solid immersion lens (SIL), and has an area less than the area of the wafer, but no less than the larger of the area of an optical collection area and an electrical probe assembly. The equal and opposing forces cause the wafer to conform to the shape of the contact element. Measurements, including electrical testing, optical probing and wafer characterization are performed on the wafer.

摘要翻译： 位于接触元件上的半导体晶片具有施加到其前侧的空间分布的力，并且施加到其背面的相等且相反的力。 接触元件包括固体浸没透镜（SIL），并且具有小于晶片的面积，但不小于光学收集区域和电探针组件的面积中的较大者的面积。 相等和相反的力使晶片符合接触元件的形状。 在晶片上进行测量，包括电测试，光学探测和晶片表征。

公开(公告)号：US08688020B2

公开(公告)日：2014-04-01

申请号：US13357429

申请日：2012-01-24

申请人： Lawrence Arnold Clark ,  Steven Matthew Russel ,  Stephen Bradley Williams ,  Paul M. Fromm

发明人： Lawrence Arnold Clark ,  Steven Matthew Russel ,  Stephen Bradley Williams ,  Paul M. Fromm

IPC分类号： G03G15/20

CPC分类号： G03G15/2028 ,  G03G15/2053 ,  G03G2215/2029

摘要： A self-positioning belt roll fuser stripping apparatus and system includes an internal pressure roll entraining a fuser belt. The internal pressure engages an external pressure roll to form a fusing nip. The internal pressure roll includes an internal pressure roll bearing to which a mounting plate is attached, allowing the mounting plate to move about a rotational axis of the internal pressure roll. A strip bar is attached to the mounting plate, and configured to force the fuser belt toward the external pressure roll. A mounting plate ski is configured to contact an external pressure roll bearing to limit movement of the mounting plate, positioning the strip shoe as desired when the mounting plate is moved to guide the strip show toward the fusing nip.

摘要翻译： 自定位带卷筒定影器剥离装置和系统包括夹带定影带的内部压力辊。 内部压力接合外部压力辊以形成定影辊隙。 内压辊包括内压辊轴承，安装板附接到内压辊轴承，允许安装板围绕内压辊的旋转轴线移动。 带状条附接到安装板，并且构造成将定影带朝向外部压力辊。 安装板滑雪板构造成接触外部压力滚动轴承以限制安装板的移动，当安装板移动以便朝向定影辊隙引导条带展示时，根据需要定位条形鞋。

公开(公告)号：US20130189006A1

公开(公告)日：2013-07-25

申请号：US13357404

申请日：2012-01-24

申请人： Lawrence Arnold CLARK ,  Steven Matthew Russel ,  Stephen Bradley Williams

发明人： Lawrence Arnold CLARK ,  Steven Matthew Russel ,  Stephen Bradley Williams

IPC分类号： G03G15/20

CPC分类号： G03G15/2028 ,  G03G2215/2041

摘要： A belt-roll fuser system includes a belt-roll fuser apparatus wherein a belt is entrained about at least a first internal pressure roll and a second internal pressure roll. The first internal pressure roll and the second internal pressure roll are configured to force a belt against an external pressure roll at a fusing nip, the belt conforming to the external pressure roll across substantially a length of the fusing nip. A passive belt support may interpose internal pressure rolls for ensuring a consistent fusing pressure across the length of the nip. A pressure belt may interpose the fuser belt and the internal pressure rolls.

摘要翻译： 带束式定影器系统包括带束式定影器装置，其中带被夹带在至少第一内压辊和第二内压辊周围。 第一内部压力辊和第二内部压力辊被配置成在定影辊隙处迫使皮带抵靠外部压力辊，该皮带符合外部压力辊跨过定影辊隙的大致长度。 被动皮带支架可以插入内部压力辊，以确保在压区的整个长度上保持一致的定影压力。 压力带可以插入定影带和内部压力辊。

公开(公告)号：US20130189004A1

公开(公告)日：2013-07-25

申请号：US13357429

申请日：2012-01-24

申请人： Lawrence Arnold Clark ,  Steven Matthew Russell ,  Stephen Bradley Williams ,  Paul M. Fromm

发明人： Lawrence Arnold Clark ,  Steven Matthew Russell ,  Stephen Bradley Williams ,  Paul M. Fromm

IPC分类号： G03G15/20

CPC分类号： G03G15/2028 ,  G03G15/2053 ,  G03G2215/2029

摘要： A self-positioning belt roll fuser stripping apparatus and system includes an internal pressure roll entraining a fuser belt. The internal pressure engages an external pressure roll to form a fusing nip. The internal pressure roll includes an internal pressure roll bearing to which a mounting plate is attached, allowing the mounting plate to move about a rotational axis of the internal pressure roll. A strip bar is attached to the mounting plate, and configured to force the fuser belt toward the external pressure roll. A mounting plate ski is configured to contact an external pressure roll bearing to limit movement of the mounting plate, positioning the strip shoe as desired when the mounting plate is moved to guide the strip show toward the fusing nip.

摘要翻译： 自定位带卷筒定影器剥离装置和系统包括夹带定影带的内部压力辊。 内部压力接合外部压力辊以形成定影辊隙。 内压辊包括内压辊轴承，安装板附接到内压辊轴承，允许安装板围绕内压辊的旋转轴线移动。 带状条附接到安装板，并且构造成将定影带朝向外部压力辊。 安装板滑雪板构造成接触外部压力滚动轴承以限制安装板的移动，当安装板移动以便朝向定影辊隙引导条带展示时，根据需要定位条形鞋。

公开(公告)号：US08248097B2

公开(公告)日：2012-08-21

申请号：US12417454

申请日：2009-04-02

申请人： Stephen Bradley Ippolito ,  Alan J. Weger

发明人： Stephen Bradley Ippolito ,  Alan J. Weger

IPC分类号： G01R31/02

CPC分类号： G01R31/311

摘要： A semiconductor wafer resting on a contact element has a spatially distributed force applied to its frontside and an equal and opposing force applied to its backside. The contact element comprises a solid immersion lens (SIL), and has an area less than the area of the wafer, but no less than the larger of the area of an optical collection area and an electrical probe assembly. The equal and opposing forces cause the wafer to conform to the shape of the contact element. Measurements, including electrical testing, optical probing and wafer characterization are performed on the wafer.

摘要翻译： 位于接触元件上的半导体晶片具有施加到其前侧的空间分布的力，并且施加到其背面的相等且相反的力。 接触元件包括固体浸没透镜（SIL），并且具有小于晶片的面积，但不小于光学收集区域和电探针组件的面积中的较大者的面积。 相等和相反的力使晶片符合接触元件的形状。 在晶片上进行测量，包括电测试，光学探测和晶片表征。

公开(公告)号：US06519374B1

公开(公告)日：2003-02-11

申请号：US09281235

申请日：1999-03-30

申请人： Christopher Robert Stook ,  Stephen Bradley Krasulick

发明人： Christopher Robert Stook ,  Stephen Bradley Krasulick

IPC分类号： G02F1035

CPC分类号： H03F1/3223 ,  H03F1/3241

摘要： A predistortion arrangement is described for using an input signal to drive a nonlinear device having a drive input. Initially, first means sample a portion of the input signal. The sampled portion of the input signal is introduced to at least one predistortion path including a mixer responsive to the sampled portion of the input signal for producing at least second order intermodulation products of the input signal. The second order intermodulation products are conditioned. Combining means then combine the conditioned second order intermodulation products with the sampled input signal in a way which produces a predistorted drive signal compensated for second order distortion for use in driving the drive input of the nonlinear device. In one aspect, the sampling means and the combining means may be provided using resistive networks. The use of the resistive networks eliminates the need for directional couplers incorporating magnetic components. Accordingly, the predistortion arrangement including the mixer and the resistive networks may be provided in the form of an integrated circuit.

摘要翻译： 描述了使用输入信号来驱动具有驱动输入的非线性装置的预失真装置。 最初，首先意味着对输入信号的一部分进行采样。 输入信号的采样部分被引入到包括响应于输入信号的采样部分的混合器的至少一个预失真路径，用于产生输入信号的至少二阶互调产物。 二阶互调产品是有条件的。 组合装置然后将经调节的二阶互调产物与采样的输入信号组合，以产生补偿二阶失真的预失真驱动信号用于驱动非线性装置的驱动输入。 在一个方面，采样装置和组合装置可以使用电阻网络来提供。 电阻网络的使用消除了包含磁性部件的定向耦合器的需要。 因此，包括混频器和电阻网络的预失真装置可以以集成电路的形式提供。

公开(公告)号：US20110037973A1

公开(公告)日：2011-02-17

申请号：US12911781

申请日：2010-10-26

申请人： Stephen Bradley Ippolito ,  Darrell L. Miles ,  Peilin Song ,  John D. Sylvestri

发明人： Stephen Bradley Ippolito ,  Darrell L. Miles ,  Peilin Song ,  John D. Sylvestri

IPC分类号： G01N21/88

CPC分类号： G01R31/311

摘要： A structure for locating a fault in a semiconductor chip. The chip includes a substrate on a dielectric interconnect. A first electrical response image of the chip, which includes a spot representing the fault, is overlayed on a first reflection image for monochromatic light in an optical path from an optical microscope through a SIL/NAIL and into the chip. The index of refraction of the substrate exceeds that of the dielectric interconnect and is equal to that of the SIL/NAIL. A second electrical response image of the chip is overlayed on a second reflection image for the monochromatic light in an optical path in which an optical stop prevents all subcritical angular components of the monochromatic light from being incident on the SIL/NAIL. If the second electrical response image includes or does not include the spot, then the fault is in the substrate or the dielectric interconnect, respectively.

摘要翻译： 用于定位半导体芯片中的故障的结构。 芯片包括电介质互连上的衬底。 包括代表故障的点的芯片的第一电响应图像重叠在从光学显微镜通过SIL / NAIL并进入芯片的光路中的单色光的第一反射图像上。 衬底的折射率超过电介质互连的折射率，等于SIL / NAIL的折射率。 芯片的第二电响应图像覆盖在光路中的单色光的第二反射图像上，其中光学停止器防止单色光的所有亚临界角分量入射到SIL / NAIL上。 如果第二电响应图像包括或不包括点，则故障分别在基板或电介质互连中。

公开(公告)号：US07817950B2

公开(公告)日：2010-10-19

申请号：US12363724

申请日：2009-01-31

申请人： William A. Burton ,  Anthony S. Condello ,  Augusto E. Barton ,  Stephen Bradley Williams ,  Paul Michael Fromm ,  Lawrence Arnold Clark

发明人： William A. Burton ,  Anthony S. Condello ,  Augusto E. Barton ,  Stephen Bradley Williams ,  Paul Michael Fromm ,  Lawrence Arnold Clark

IPC分类号： G03G15/20

CPC分类号： G03G15/6573 ,  G03G15/2028 ,  G03G2215/00573 ,  G03G2215/00746 ,  G03G2215/2006 ,  G03G2215/2022

摘要： Apparatuses useful for printing and methods for stripping media from surfaces in apparatuses useful for printing are disclosed. An apparatus useful for printing including a first member including a first outer surface; a second member including a second outer surface; a belt including an inner surface and an outer surface; a first nip formed by contact between the inner surface of the belt and the second outer surface and contact between the outer surface of the belt and the first outer surface; and a stripping mechanism including a stripping member disposed internal to the belt. The stripping member is positionable relative to the first nip to vary a pressure applied by the outer surface of the belt against the first outer surface downstream from the first nip. The media are stripped from the outer surface of the belt after exiting from the first nip.

摘要翻译： 公开了用于打印的设备和用于从用于打印的设备中的表面剥离介质的方法。 一种用于印刷的装置，包括包括第一外表面的第一构件; 包括第二外表面的第二构件; 包括内表面和外表面的带; 通过所述带的内表面和所述第二外表面之间的接触形成的第一辊隙和所述带的外表面与所述第一外表面之间的接触; 以及包括设置在所述带内部的剥离构件的剥离机构。 剥离构件可相对于第一压区定位，以改变由带的外表面相对于第一压区下游的第一外表面施加的压力。 从第一压区离开后，介质从带的外表面剥离。

公开(公告)号：US20100253379A1

公开(公告)日：2010-10-07

申请号：US12417454

申请日：2009-04-02

申请人： Stephen Bradley Ippolito ,  Alan J. Weger

发明人： Stephen Bradley Ippolito ,  Alan J. Weger

IPC分类号： G01R31/02

CPC分类号： G01R31/311

摘要： A semiconductor wafer resting on a contact element has a spatially distributed force applied to its frontside and an equal and opposing force applied to its backside. The contact element comprises a solid immersion lens (SIL), and has an area less than the area of the wafer, but no less than the larger of the area of an optical collection area and an electrical probe assembly. The equal and opposing forces cause the wafer to conform to the shape of the contact element. Measurements, including electrical testing, optical probing and wafer characterization are performed on the wafer.

摘要翻译： 位于接触元件上的半导体晶片具有施加到其前侧的空间分布的力，并且施加到其背面的相等且相反的力。 接触元件包括固体浸没透镜（SIL），并且具有小于晶片的面积，但不小于光学收集区域和电探针组件的面积中的较大者的面积。 相等和相反的力使晶片符合接触元件的形状。 在晶片上进行测量，包括电测试，光学探测和晶片表征。

公开(公告)号：US20100150585A1

公开(公告)日：2010-06-17

申请号：US12335591

申请日：2008-12-16

申请人： Melissa Ann MONAHAN ,  William Alexander BURTON ,  Paul M. FROMM ,  Stephen Bradley WILLIAMS ,  Julie Marie HANFLAND

发明人： Melissa Ann MONAHAN ,  William Alexander BURTON ,  Paul M. FROMM ,  Stephen Bradley WILLIAMS ,  Julie Marie HANFLAND

IPC分类号： G03G15/20

CPC分类号： G03G15/2064

摘要： A method and apparatus for measuring nip width in an image production device is disclosed. The method may include receiving a signal to measure the nip width, the nip width being the distance of an arc length created by an intersection of the fuser roll and the pressure roll, positioning a nip width measuring device into the nip, measuring the nip width, determining if the measured nip width meets a required nip width, wherein if the measured nip width does not meet the required nip width, adjusting the nip width.

摘要翻译： 公开了一种用于测量图像产生装置中的压区宽度的方法和装置。 该方法可以包括接收测量夹持宽度的信号，夹持宽度是由定影辊和压力辊的交点产生的弧长的距离，将压区宽度测量装置定位到压区中，测量压区宽度 确定测量的压区宽度是否满足所需的压区宽度，其中如果所测量的压区宽度不满足所需的压区宽度，则调整压区宽度。