Integrated circuit with configuration based on parameter measurement
    3.
    发明授权
    Integrated circuit with configuration based on parameter measurement 有权
    集成电路配置基于参数测量

    公开(公告)号:US07107362B2

    公开(公告)日:2006-09-12

    申请号:US10440634

    申请日:2003-05-19

    IPC分类号: G06F13/00

    摘要: Embodiments of the present invention provide an integrated circuit. In one embodiment, the integrated circuit comprises logic blocks, a measurement circuit and a control circuit. The measurement circuit is configured to measure operating parameters of the integrated circuit and the logic blocks and provide operating parameter data. The control circuit is configured to receive the operating parameter data, evaluate the operating parameter data to obtain configuration data and configure the integrated circuit with the configuration data.

    摘要翻译: 本发明的实施例提供一种集成电路。 在一个实施例中,集成电路包括逻辑块,测量电路和控制电路。 测量电路被配置为测量集成电路和逻辑块的操作参数并提供操作参数数据。 控制电路被配置为接收操作参数数据,评估操作参数数据以获得配置数据并且使用配置数据来配置集成电路。