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公开(公告)号:US12153069B2
公开(公告)日:2024-11-26
申请号:US18115784
申请日:2023-03-01
Applicant: Shih-Ching Tan , Chun-Nan Ou , Tzu-Fu Chen , Chen-Chou Wen , Chiang-Cheng Fan
Inventor: Shih-Ching Tan , Chun-Nan Ou , Tzu-Fu Chen , Chen-Chou Wen , Chiang-Cheng Fan
IPC: G01R1/073
Abstract: The present invention provides a battery probing module, for testing a battery defined with a contact surface having a first electrode area and a second electrode area with different polarities. The battery probing module comprises a frame and a plurality of probe units. The frame has a top plate and a bottom plate opposite to the top plate. Each of the plurality of probe units comprises a base, a first probe, and a plurality of second probes. The base is defined with a top surface and a bottom surface deflectably fixed to the top surface by a fixing unit. The first probe and the plurality of second probes protrude from the bottom surface for contacting the first electrode area and the second electrode area respectively. Wherein the first probe is within a periphery surrounded by the plurality of second probes in a vertical direction of the bottom surface.
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公开(公告)号:US20230288449A1
公开(公告)日:2023-09-14
申请号:US18115784
申请日:2023-03-01
Applicant: Shih-Ching TAN , Chun-Nan OU , Tzu-Fu CHEN , Chen-Chou WEN , Chiang-Cheng FAN
Inventor: Shih-Ching TAN , Chun-Nan OU , Tzu-Fu CHEN , Chen-Chou WEN , Chiang-Cheng FAN
IPC: G01R1/073
CPC classification number: G01R1/073
Abstract: The present invention provides a battery probing module, for testing a battery defined with a contact surface having a first electrode area and a second electrode area with different polarities. The battery probing module comprises a frame and a plurality of probe units. The frame has a top plate and a bottom plate opposite to the top plate. Each of the plurality of probe units comprises a base, a first probe, and a plurality of second probes. The base is defined with a top surface and a bottom surface deflectably fixed to the top surface by a fixing unit. The first probe and the plurality of second probes protrude from the bottom surface for contacting the first electrode area and the second electrode area respectively. Wherein the first probe is within a periphery surrounded by the plurality of second probes in a vertical direction of the bottom surface.
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公开(公告)号:USD512707S1
公开(公告)日:2005-12-13
申请号:US29209564
申请日:2004-07-16
Applicant: Tzu-Fu Chen , Ming-Hwa Ching
Designer: Tzu-Fu Chen , Ming-Hwa Ching
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