摘要:
A method and apparatus for detecting predetermined surface characteristics in head gimbal assemblies to improve hard disk drive reliability. The predetermined surface characteristics include head slider protrusions such as scratches or contamination that can cause damage to the head or disk in hard drives. By detecting these protrusions, those drives with an increased chance of failure can be removed from a test group, thereby increasing the quality and reliability of the remaining disk drives. The invention provides a method of detecting these protrusions that is a more practical option than using a scanning electron microscope (SEM) to inspect each head slider.
摘要:
Disclosed are compounds of the general formula:R--O--Ar--COS--Ph--COO--R'characterized by the presence of the thioester (--COS--) core and wherein R is an alkyl group with typically 8 to 16 carbon atoms, Ar is a substituted aromatic core group such as 1,4-benzene, 2,6-naphthalene, 4,4'-biphenyl, or 4,4'-diphenylethane, and R' is a chiral branched alkyl group such as the 1-substituted cases 1-methylpropyl through 1-methyloctyl or 2-substituted case such as 2-methylbutyl. These materials or their mixtures possess ferroelectric phases and as such are of interest for electro-optical applications. In certain cases specific materials are of particular interest due to the existence of stable ferroelectric phases near room temperature with large polarization density and fast electro-optic response.
摘要:
A method and apparatus for detecting predetermined surface characteristics in head gimbal assemblies to improve hard disk drive reliability. The predetermined surface characteristics include head slider protrusions such as scratches or contamination that can cause damage to the head or disk in hard drives. By detecting these protrusions, those drives with an increased chance of failure can be removed from a test group, thereby increasing the quality and reliability of the remaining disk drives. The invention provides a method of detecting these protrusions that is a more practical option than using a scanning electron microscope (SEM) to inspect each head slider.