LED TESTING PROCESS AND CORRECTION METHODS THEREFOR
    2.
    发明申请
    LED TESTING PROCESS AND CORRECTION METHODS THEREFOR 有权
    LED测试过程及其校正方法

    公开(公告)号:US20150198480A1

    公开(公告)日:2015-07-16

    申请号:US14587332

    申请日:2014-12-31

    IPC分类号: G01J1/42

    摘要: Disclosed is a method of generating a correction function for a light-emitting diode (LED) testing process. The method comprises the steps of: detecting light emitted by a reference LED and reflected from one or more inactive LEDs on a panel within a field of view of a detector, a number of said inactive LEDs within the field of view being varied such that uncorrected values of at least one optical parameter are derivable as a function of the number of inactive LEDs in the field of view; detecting light emitted by the reference LED, or by an active LED having identical optical properties to the reference LED, in the absence of any other LEDs, to determine at least one reference value for the or each said optical parameter; and calculating differences between the uncorrected values and the or each reference value to generate the correction function, the correction function being based on the number of inactive LEDs which are arranged within the field of view of the detector when the detector detects light emitted by an LED under test.

    摘要翻译: 公开了一种产生用于发光二极管(LED)测试过程的校正功能的方法。 该方法包括以下步骤:检测由参考LED发射并由检测器的视野内的面板上的一个或多个不活动的LED反射的光,视场内的所述非活动LED的数量是变化的,使得未校正 至少一个光学参数的值可以作为视野中的非活动LED的数量的函数导出; 在没有任何其他LED的情况下,检测由参考LED发射的光,或者通过与参考LED具有相同光学特性的有源LED,以确定所述光学参数或每个所述光学参数的至少一个参考值; 以及计算所述未校正值和所述或每个参考值之间的差异以产生所述校正功能,所述校正功能基于当所述检测器检测到由所述LED发射的光时,所述校正功能基于被布置在所述检测器的视场内的非活动LED的数量 被测试。