Test apparatus, test method, and computer-readable storage medium

    公开(公告)号:US11788885B2

    公开(公告)日:2023-10-17

    申请号:US17577385

    申请日:2022-01-18

    CPC classification number: G01J1/44 G01J2001/4252

    Abstract: A test apparatus includes: an electrical connection unit electrically connected to a terminal of each of a plurality of light emitting devices to be tested; a light source unit for collectively irradiating the plurality of light emitting devices with light; an electrical measurement unit for measuring a photoelectric signal obtained by photoelectrically converting the light irradiated from the light source unit by each light emitting device; a light emission control unit for causing at least one light emitting device to be subjected to light emission processing to emit light; a light measuring unit for measuring light emitted by the at least one light emitting device to be subjected to the light emission processing; and a determination unit determining a quality of each light emitting device on the basis of a measurement result of the electrical measurement unit and a measurement result of the light measuring unit.

    UNEVENNESS EVALUATION METHOD AND UNEVENNESS EVALUATION APPARATUS

    公开(公告)号:US20190137334A1

    公开(公告)日:2019-05-09

    申请号:US16096264

    申请日:2017-03-16

    Applicant: IIX INC.

    Inventor: Hiroshi Murase

    Abstract: Given that a plurality of visual transfer function curves for a display panel are provided for each of different ranges from the display panel, two-dimensional luminance distribution data of the display panel is filtered using a filter having visual frequency characteristics substantially passing through: a part where a recognition sensitivity increases as a spatial frequency increases in a short-range function curve, which among the plurality of visual transfer function curves is the closest to the display panel; a peak part of the short-range function curve; a peak part in a long-range function curve, which among the plurality of visual transfer function curves is the farthest from the display panel; and a part where the recognition sensitivity decreases as the spatial frequency increases in the long-range function curve. An evaluation value of luminance unevenness of the display panel is calculated on the basis of the filtered two-dimensional filtering data.

    Method and Apparatus for Testing Optical Outputs

    公开(公告)号:US20170234727A1

    公开(公告)日:2017-08-17

    申请号:US15432583

    申请日:2017-02-14

    Abstract: A method comprising optically detecting optical output states of a plurality of light sources of an optical device over a test interval; for each light source, optically detecting that the output state of the light source has changed from a first optical condition to a second optical condition; for each light source, optically detecting that the output state of the light source has changed from the second optical condition to a third optical condition; for each light source, determining a first time interval representative of the first optical condition; for each light source, determining a second time interval representative of the second optical condition; for each light source, determining a third time interval representative of the third optical condition; determining a test result for the device based on a comparison of the first, second and third time intervals with pre-stored time intervals.

    Inspection device
    9.
    发明授权

    公开(公告)号:US09599659B2

    公开(公告)日:2017-03-21

    申请号:US14722746

    申请日:2015-05-27

    Applicant: Keiji Tsuda

    Inventor: Keiji Tsuda

    CPC classification number: G01R31/2635 G01J1/0271 G01J1/42 G01J2001/4252

    Abstract: An inspection device is provided including a light emitting element configured to emit light, a light receiving element arranged so as to face the light emitting element and configured to receive the light, where one of the light emitting element and the light receiving element is used as a to-be-inspected element, and the other one of the light emitting element and the light receiving element is used as an inspection element that inspects the to-be-inspected element, a housing configured to accommodate the inspection element, and a lid configured to be detachable from the housing. In the inspection device, one of the housing and the lid is provided with an arrangement unit to which the to-be-inspected element is set in a detachable manner, and the lid includes a contact unit that electrically contacts the to-be-inspected element by touching and detaching from the to-be-inspected element.

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