公开(公告)号：US20090063062A1

公开(公告)日：2009-03-05

申请号：US12222992

申请日：2008-08-21

申请人： Yuzo Takamatsu ,  Hiroshi Takahashi ,  Yoshinobu Higami ,  Michinobu Nakao ,  Takashi Aikyo ,  Michiaki Emori ,  Hideo Ohmae

发明人： Yuzo Takamatsu ,  Hiroshi Takahashi ,  Yoshinobu Higami ,  Michinobu Nakao ,  Takashi Aikyo ,  Michiaki Emori ,  Hideo Ohmae

IPC分类号： G01R31/28

CPC分类号： G01R31/3193

摘要： A fault test apparatus for testing a fault on each signal line in a circuit under test including signal lines includes a controller, which calculates a value of a fault excitation function for a fault signal line, using the fault excitation function representing a fitness result of a predetermined fault excitation condition between the fault signal line having a fault among the signal lines under test in the circuit under test and at least one of adjacent signal lines adjacent to the fault signal line and falling within a predetermined range from the fault signal line, based on layout information between the fault signal line and at least one adjacent signal line adjacent to the fault signal line, manufacturing parameter information, and timing information, and then, determines whether or not a dynamic fault is excited on the fault signal line based on the value of the fault excitation function.

摘要翻译： 用于测试包括信号线在内的被测电路中的每个信号线上的故障的故障测试装置包括一个控制器，该控制器使用表示一个适应度结果的故障激励函数来计算故障信号线的故障激励函数的值 基于被测电路的被测试信号线之间的故障的故障信号线与与故障信号线相邻的相邻信号线中的至少一个与故障信号线相关的预定范围内的预定故障激励条件 在故障信号线与与故障信号线相邻的至少一个相邻信号线之间的布局信息，制造参数信息和定时信息上，然后基于该故障信号线确定动态故障是否在故障信号线上被激励 故障励磁功能的值。

公开(公告)号：US07983858B2

公开(公告)日：2011-07-19

申请号：US12222992

申请日：2008-08-21

申请人： Yuzo Takamatsu ,  Hiroshi Takahashi ,  Yoshinobu Higami ,  Michinobu Nakao ,  Takashi Aikyo ,  Michiaki Emori ,  Hideo Ohmae

发明人： Yuzo Takamatsu ,  Hiroshi Takahashi ,  Yoshinobu Higami ,  Michinobu Nakao ,  Takashi Aikyo ,  Michiaki Emori ,  Hideo Ohmae

IPC分类号： G06F19/00

CPC分类号： G01R31/3193

摘要： A fault test apparatus for testing a fault on each signal line in a circuit under test including signal lines includes a controller, which calculates a value of a fault excitation function for a fault signal line, using the fault excitation function representing a fitness result of a predetermined fault excitation condition between the fault signal line having a fault among the signal lines under test in the circuit under test and at least one of adjacent signal lines adjacent to the fault signal line and falling within a predetermined range from the fault signal line, based on layout information between the fault signal line and at least one adjacent signal line adjacent to the fault signal line, manufacturing parameter information, and timing information, and then, determines whether or not a dynamic fault is excited on the fault signal line based on the value of the fault excitation function.

摘要翻译： 用于测试包括信号线在内的被测电路中的每个信号线上的故障的故障测试装置包括一个控制器，该控制器使用表示一个适应度结果的故障激励函数来计算故障信号线的故障激励函数的值 基于被测电路的被测试信号线之间的故障的故障信号线与与故障信号线相邻的相邻信号线中的至少一个与故障信号线相关的预定范围内的预定故障激励条件 在故障信号线与与故障信号线相邻的至少一个相邻信号线之间的布局信息，制造参数信息和定时信息上，然后基于该故障信号线确定动态故障是否在故障信号线上被激励 故障励磁功能的值。