ENCODER FOR OPTICAL COHERENCE TOMOGRAPHY SCANNER

    公开(公告)号:US20190011250A1

    公开(公告)日:2019-01-10

    申请号:US16067337

    申请日:2017-01-20

    Applicant: 3SHAPE A/S

    Abstract: Disclosed is an optical coherence tomography scanner and a method for recording sub-surface scans of an object, wherein a position encoder is arranged in the path of the probing beam of an interferometric system. The encoder pattern is detected in a sequence of A scans at generated for different probing beam positions on the scanned object, the probing beam position and/or inclination for at least one A scan of said sequence of A scans is deducing based on the detected encoder pattern, and the sub-surface scan of the object is generated based on the sequence of A scans taking into account the deduced probing beam position and/or inclination.

    Method for generating dental models based on an objective function

    公开(公告)号:US12138132B2

    公开(公告)日:2024-11-12

    申请号:US17429108

    申请日:2020-02-06

    Applicant: 3SHAPE A/S

    Abstract: A computer-implemented method of generating a dental model based on an objective function output, including creating an objective function including at least one quality estimation function which trains at least one machine learning method that generates quality estimation output, and an objective function output is the output of the objective function providing a model as an input data to the objective function and generating model-related objective function output; and modifying the model based on the model-related objective function output to transform the model to a generated model, wherein the generated model is the dental model.

    Encoder for optical coherence tomography scanner

    公开(公告)号:US10684115B2

    公开(公告)日:2020-06-16

    申请号:US16067337

    申请日:2017-01-20

    Applicant: 3SHAPE A/S

    Abstract: Disclosed is an optical coherence tomography scanner and a method for recording sub-surface scans of an object, wherein a position encoder is arranged in the path of the probing beam of an interferometric system. The encoder pattern is detected in a sequence of A scans at generated for different probing beam positions on the scanned object, the probing beam position and/or inclination for at least one A scan of said sequence of A scans is deducing based on the detected encoder pattern, and the sub-surface scan of the object is generated based on the sequence of A scans taking into account the deduced probing beam position and/or inclination.

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