公开(公告)号：US11543237B2

公开(公告)日：2023-01-03

申请号：US17269421

申请日：2018-08-23

Applicant: ABB Schweiz AG

Inventor： Jacobus Lodevicus Martinus Van Mechelen ,  Deran Maas ,  Andreas Frank

IPC: G01B11/06 ,  G01N21/3581 ,  G01N21/55 ,  G01N21/84

Abstract: A method for inspection of a target object, the method including irradiating a reference surface having a non-flat reference profile with radiation; determining reference response data based on detected radiation having interacted with the reference surface; irradiating a target object with radiation, the target object including a target surface having a non-flat target profile corresponding to the reference profile; determining inspection response data based on detected radiation having interacted with the target object; and determining at least one parameter of the target object based on the reference response data and the inspection response data. An alternative method; a control system for controlling an emitter system and a detector system; and an inspection system including a control system, an emitter system and a detector system, are also provided.

公开(公告)号：US20200306780A1

公开(公告)日：2020-10-01

申请号：US16881643

申请日：2020-05-22

Applicant: ABB Schweiz AG

Inventor： Deran Maas ,  Branimir Radisavljevic ,  Mariya Porus ,  Jacobus Lodevicus Martinus Van Mechelen

IPC: B05B12/08 ,  G01B11/06 ,  B05B13/04 ,  B05B16/20 ,  B25J19/02 ,  H04L29/08

Abstract: A sensor system and method for measuring a parameter of a paint layer provided on a surface of an object includes a robot arm and a measuring device mounted to the robot arm. The measuring device includes a radiation emitter and a radiation receiver, a sensor arrangement and a control unit. The sensor system and method carries out a measurement of a parameter of the paint layer at a predefined measuring location by accounting for positioning data and measurement data sot that, prior to a measurement, a distance between the measuring device and the surface of the object is adjusted to be in a predefined distance range, and a vector of the measuring direction of the measuring device is adjusted to be normal with respect to the surface of the object within an angular tolerance range from −5° to 5°.

公开(公告)号：US11513068B2

公开(公告)日：2022-11-29

申请号：US16846892

申请日：2020-04-13

Applicant: ABB Schweiz AG

Inventor： Deran Maas ,  Branimir Radisavljevic ,  Mariya Porus ,  Jacobus Lodevicus Martinus Van Mechelen

IPC: G01N21/3586 ,  G01N33/32

Abstract: A method and apparatus for detecting a pulsed THz beam includes emitting, by THz emitter, pulsed THz radiation of outgoing pulse shape for interacting with target body; detecting, by THz detector, incoming THz radiation comprising THz pulses, and outputting, by THz detector, a raw detector data of pulse shapes of incoming THz pulses; and determining, by pulse shape reconstruction module, a reconstructed incoming pulse shape based on the raw detector data, measuring, by sensor, a time-of-flight quantity (d) affecting the time of flight of the THz radiation; and adjusting operation of at least one of THz emitter, THz detector and pulse shape reconstruction module using the time-of-flight quantity (d), for correcting for variations in time of flight of the THz radiation.

公开(公告)号：US20200240909A1

公开(公告)日：2020-07-30

申请号：US16846892

申请日：2020-04-13

Applicant: ABB Schweiz AG

Inventor： Deran Maas ,  Branimir Radisavljevic ,  Mariya Porus ,  Jacobus Lodevicus Martinus Van Mechelen

IPC: G01N21/3586 ,  G01N33/32

Abstract: A method and apparatus for detecting a pulsed THz beam includes emitting, by THz emitter, pulsed THz radiation of outgoing pulse shape for interacting with target body; detecting, by THz detector, incoming THz radiation comprising THz pulses, and outputting, by THz detector, a raw detector data of pulse shapes of incoming THz pulses; and determining, by pulse shape reconstruction module, a reconstructed incoming pulse shape based on the raw detector data, measuring, by sensor, a time-of-flight quantity (d) affecting the time of flight of the THz radiation; and adjusting operation of at least one of THz emitter, THz detector and pulse shape reconstruction module using the time-of-flight quantity (d), for correcting for variations in time of flight of the THz radiation.

公开(公告)号：US20220107631A1

公开(公告)日：2022-04-07

申请号：US17310357

申请日：2019-02-04

Applicant: ABB Schweiz AG

Inventor： Daniele Angelosante ,  Jacobus Lodevicus Martinus Van Mechelen ,  Deran Maas ,  Giorgio Signorello ,  Marco Guerriero

IPC: G05B19/418 ,  B05B12/08 ,  B05B13/04

Abstract: A method for modelling a coating process including a plurality of coating parameters, includes the steps of: dispensing, by the coating process and during K work cycles, a coating on each of K pieces of objects to thereby obtain K pieces of coatings; recording, during each of the K work cycles, coating variable values of p coating parameters at M instances to thereby obtain recording results; and measuring at least one coating property at m locations of each of the K pieces of coatings to thereby obtain measurement results. The method is characterized by the step of determining a digital twin of the coating process on the basis of the recording results and the measurement results. By using results from a large amount of classical quality control measurements together with corresponding coating parameter information, a digital twin of the coating process can be determined through statistical processing of such big data. The digital twin) may be used either for automatic adjustment of the coating parameters to obtain an improved coating quality, for prediction of the coating quality right after a work cycle to obtain an improved quality control, or for both.

公开(公告)号：US20210190478A1

公开(公告)日：2021-06-24

申请号：US17269421

申请日：2018-08-23

Applicant: ABB Schweiz AG

Inventor： Jacobus Lodevicus Martinus Van Mechelen ,  Deran Maas ,  Andreas Frank

IPC: G01B11/06 ,  G01N21/55 ,  G01N21/3581 ,  G01N21/84

Abstract: A method for inspection of a target object, the method including irradiating a reference surface having a non-flat reference profile with radiation; determining reference response data based on detected radiation having interacted with the reference surface; irradiating a target object with radiation, the target object including a target surface having a non-flat target profile corresponding to the reference profile; determining inspection response data based on detected radiation having interacted with the target object; and determining at least one parameter of the target object based on the reference response data and the inspection response data. An alternative method; a control system for controlling an emitter system and a detector system; and an inspection system including a control system, an emitter system and a detector system, are also provided.

公开(公告)号：US10041785B2

公开(公告)日：2018-08-07

申请号：US15555429

申请日：2015-03-03

Applicant: ABB Schweiz AG

Inventor： Jacobus Lodevicus Martinus Van Mechelen

IPC: G01B11/06 ,  G01N33/32 ,  G01N21/3581 ,  G01N21/59 ,  G01N21/84

Abstract: A method of characterizing a wet paint layer stack of a painted body by individual parameters of the wet paint layers, based on fitting to a physical model, is provided. The method includes: emitting a THz radiation signal towards the painted body such that the THz radiation interacts with the wet paint layer stack; detecting a response signal being the detected THz radiation signal having interacted with the wet paint layer stack; determining model parameters of the physical model by optimizing the model parameters such that a predicted response signal of the physical model is fitted to the detected response signal, at least some of the model parameters being indicative of optical properties of the wet paint layers and of a wet paint layer thickness; and determining, from the determined model parameters, the individual paint layer parameters of at least one of the wet paint layers.

公开(公告)号：US09689796B2

公开(公告)日：2017-06-27

申请号：US14607872

申请日：2015-01-28

Applicant: ABB Schweiz AG

Inventor： Jacobus Lodevicus Martinus Van Mechelen

IPC: G01N21/35 ,  G01N33/32 ,  G01B11/06 ,  G01N21/3581

CPC classification number: G01N21/3581 ,  G01B11/0616 ,  G01B11/0625 ,  G01B11/0683 ,  G01N33/32 ,  G01N2201/061 ,  G01N2201/12

Abstract: A method of characterizing a wet paint layer of a painted body by paint layer parameters based on fitting to a physical model is provided. The method is carried out by a sensor system in a non-contact manner, the sensor system including an emitter system for emitting THz radiation, a detector system for detecting THz radiation, and a processing unit operationally coupled to the emitter system and the detector system. The method includes: Emitting, by the emitter system, a THz radiation signal towards the painted body such that the THz radiation interacts with the wet paint layer, the wet paint layer having not yet finished a drying process during which the wet paint layer becomes a dry paint layer; and Detecting, by the detector system, a response signal being the detected THz radiation signal having interacted with the wet paint layer.