公开(公告)号：US11494892B2

公开(公告)日：2022-11-08

申请号：US16999361

申请日：2020-08-21

Applicant: ABB Schweiz AG

Inventor： Nevroz Sen

IPC: G06T7/00 ,  G06T7/90 ,  G06V10/25 ,  G06V10/75

Abstract: An inspection system is provided for detecting defects on surfaces. The system uses a pattern with varying color or darkness which faces the surface. A light illuminates the pattern on the surface so that the pattern and any defects on the surface are reflected and captured for image analysis. The processor then separates the pattern from the image in order to identify the locations of any defects on the surface.

公开(公告)号：US20240087105A1

公开(公告)日：2024-03-14

申请号：US18263009

申请日：2021-01-26

Applicant: ABB Schweiz AG

Inventor： Nevroz Sen ,  WenLong Li ,  Amber-FengQin Zhu ,  Kun Chang

IPC: G06T7/00

CPC classification number: G06T7/0004 ,  G06T2207/20081 ,  G06T2207/20084 ,  G06T2207/30156

Abstract: A method for detecting paint defects on objects is provided. The method comprises: projecting a plurality of patterns on a surface of an object at a plurality of different pattern characteristics; capturing a plurality of images of the object based on projecting the plurality of patterns; inputting the plurality of images of the object into a machine learning model to determine whether the surface of the object includes one or more paint defects; and based on determining, an image, of the plurality of images, includes a paint defect, causing display of the image with the paint defect.

公开(公告)号：US20220058793A1

公开(公告)日：2022-02-24

申请号：US16999361

申请日：2020-08-21

Applicant: ABB Schweiz AG

Inventor： Nevroz Sen

IPC: G06T7/00 ,  G06T7/90 ,  G06K9/32 ,  G06K9/62

Abstract: An inspection system is provided for detecting defects on surfaces. The system uses a pattern with varying color or darkness which faces the surface. A light illuminates the pattern on the surface so that the pattern and any defects on the surface are reflected and captured for image analysis. The processor then separates the pattern from the image in order to identify the locations of any defects on the surface.

公开(公告)号：US10967514B2

公开(公告)日：2021-04-06

申请号：US16108992

申请日：2018-08-22

Applicant: ABB Schweiz AG

Inventor： Arash Mahyari ,  Nevroz Sen ,  Thomas Locher ,  Wenzhi Gao ,  Dan Dai ,  Said Zahrai

IPC: B25J9/00 ,  B25J9/16 ,  G01N19/08

Abstract: Mechanical condition monitoring of robots can be used to detect unexpected failure of robots. Data taken from a robot operation is processed and compared against a health baseline. Features extracted during the monitoring stage of robot operation are aligned with features extracted during the training stage in which the health baseline is established by projecting both onto a common subspace. A classifier which can include a distance assessment such as an L2-norm is used within the common subspace to assess the condition of the robot. Excursions of the distance assessment from a criteria indicate a failure or potential failure.

公开(公告)号：US20200061833A1

公开(公告)日：2020-02-27

申请号：US16108992

申请日：2018-08-22

Applicant: ABB Schweiz AG

Inventor： Arash Mahyari ,  Nevroz Sen ,  Thomas Locher ,  Wenzhi Gao ,  Dan Dai ,  Said Zahrai

IPC: B25J9/16 ,  G01N19/08

Abstract: Mechanical condition monitoring of robots can be used to detect unexpected failure of robots. Data taken from a robot operation is processed and compared against a health baseline. Features extracted during the monitoring stage of robot operation are aligned with features extracted during the training stage in which the health baseline is established by projecting both onto a common subspace. A classifier which can include a distance assessment such as an L2-norm is used within the common subspace to assess the condition of the robot. Excursions of the distance assessment from a criteria indicate a failure or potential failure.