公开(公告)号：US20190226829A1

公开(公告)日：2019-07-25

申请号：US16373304

申请日：2019-04-02

Applicant: ADOM, ADVANCED OPTICAL TECHNOLOGIES LTD.

Inventor： Yoel ARIELI ,  Yosef WEITZMAN

IPC: G01B9/02 ,  A61B3/10

Abstract: Apparatus and methods are described for optically analyzing an object having a plurality of layers, without needing to use a reference mirror. Light is generated using an extended broadband light source. The light is directed toward the object, such as to create respective images of the light source on the respective layers of the object. Light that is reflected from a point of the object is gathered into a conjugate point in a detector. The thicknesses of the plurality of layers at the point of the object are determined, by analyzing, within the gathered light, interference between light reflected from the plurality of layers of the object at the point. Other applications are also described.

公开(公告)号：US20170261308A1

公开(公告)日：2017-09-14

申请号：US15605947

申请日：2017-05-25

Applicant: ADOM, ADVANCED OPTICAL TECHNOLOGIES LTD.

Inventor： Yoel ARIELI ,  Yosef WEITZMAN

IPC: G01B9/02 ,  A61B3/10

CPC classification number: G01B9/0203 ,  A61B3/102 ,  G01B9/02032 ,  G01B9/02036 ,  G01B9/02043 ,  G01B9/02044 ,  G01B9/02057 ,  G01B9/02065 ,  G01B9/02091 ,  G01B2290/60

Abstract: Apparatus and methods are described for optically analyzing an object having a plurality of layers, without needing to use a reference mirror. An extended broadband light source produces light, and directs the light toward the object, such as to create respective images of the light source on the respective layers of the object. An imaging system gathers light that is reflected from a point of the object into a conjugate point in the detector. The detector determines the thicknesses of the plurality of layers at the point of the object by analyzing, within the gathered light, interference between light reflected from the plurality of layers of the object at the point. Other applications are also described.