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    SYSTEMS AND METHODS FOR GENERATING DATA BASED ON ONE OR MORE SPECTRALLY-ENCODED ENDOSCOPY TECHNIQUES
    1.
    发明申请
    SYSTEMS AND METHODS FOR GENERATING DATA BASED ON ONE OR MORE SPECTRALLY-ENCODED ENDOSCOPY TECHNIQUES 有权
    基于一种或多种频谱编码的内窥镜技术生成数据的系统和方法

    公开(公告)号：US20070263208A1

    公开(公告)日：2007-11-15

    申请号：US11621694

    申请日：2007-01-10

    申请人： Dvir Yelin ,  Seok-Hyun Yun ,  Brett Bouma ,  Guillermo Tearney

    发明人： Dvir Yelin ,  Seok-Hyun Yun ,  Brett Bouma ,  Guillermo Tearney

    IPC分类号： G01J3/36 ,  G06F17/14

    CPC分类号： G01N21/4795 ,  A61B5/0066 ,  A61B5/6852 ,  A61B5/7257 ,  A61B5/726 ,  G01B9/02002 ,  G01B9/02036 ,  G01B9/02037 ,  G01B9/02044 ,  G01B9/02091 ,  G01N21/359 ,  G01N2021/1782 ,  G01N2021/1787 ,  G01N2021/3595

    摘要： Exemplary systems and methods for generating data associated with at least one portion of a sample can be provided. For example, according to one exemplary embodiment of such systems and methods, it is possible to provide a particular radiation using at least one first arrangement. The particular radiation can include at least one first electro-magnetic radiation directed to at least one sample and at least one second electro-magnetic radiation directed to a reference arrangement. The first radiation and/or the second radiation can comprise a plurality of wavelengths. The first electro-magnetic radiation can be spectrally dispersed along at least one portion of the sample. The second electro-magnetic radiation measured at two or more different lengths of the reference arrangement with respect to the first arrangement. Data can be generated which is associated with the first and second electro-magnetic radiations obtained at the two different lengths using at least one second arrangement which comprises a spectrometer arrangement.

    摘要翻译： 可以提供用于产生与样品的至少一部分相关联的数据的示例性系统和方法。 例如，根据这样的系统和方法的一个示例性实施例，可以使用至少一个第一布置来提供特定的辐射。 特定的辐射可以包括被引导至至少一个样品的至少一个第一电磁辐射和指向参考装置的至少一个第二电磁辐射。 第一辐射和/或第二辐射可以包括多个波长。 第一电磁辐射可沿样品的至少一部分光谱分散。 在参考装置的两个或多个不同长度处相对于第一装置测量的第二电磁辐射。 可以生成与使用包括光谱仪布置的至少一个第二布置在两个不同长度获得的第一和第二电磁辐射相关联的数据。

    Apparatus for low coherence ranging
    3.
    发明申请
    Apparatus for low coherence ranging 有权
    低相干范围的装置

    公开(公告)号：US20050018200A1

    公开(公告)日：2005-01-27

    申请号：US10501268

    申请日：2003-01-10

    申请人： Tearney Guillermo ,  Brett Bouma

    发明人： Tearney Guillermo ,  Brett Bouma

    IPC分类号： G01N21/17 ,  G01N21/47 ,  G01B9/02

    CPC分类号： G01B9/02035 ,  G01B9/02028 ,  G01B9/02036 ,  G01B9/02091 ,  G01N21/4795

    摘要： An apparatus for performing low coherence ranging of a sample with high transverse resolution and large depth of focus, comprising an optical ranging system comprising a light source, a means for directing light from the light source to the sample, a means for directing reflected light from the sample to a detector, at least one detector, a means for processing light data received by the detector and which generates an image; and an optical element having a transverse resolution defined as .Δris less than or equal to about 5 μm, and a depth of focus Δz of at least about 50 μm.

    摘要翻译： 一种用于执行具有高横向分辨率和大深度聚焦的样本的低相干范围的装置，包括光学测距系统，包括光源，用于将来自光源的光引导到样本的装置，用于将来自 检测器的样本，至少一个检测器，用于处理由检测器接收的光数据并产生图像的装置; 和具有定义为小于或等于约5μm的横向分辨率和至少约50μm的聚焦深度Deltaz的光学元件。

    DIFFERENTIAL FILTERING CHROMATIC CONFOCAL MICROSCOPIC SYSTEM
    5.
    发明申请
    DIFFERENTIAL FILTERING CHROMATIC CONFOCAL MICROSCOPIC SYSTEM 审中-公开
    差分滤波色谱显微镜系统

    公开(公告)号：US20150055215A1

    公开(公告)日：2015-02-26

    申请号：US14464061

    申请日：2014-08-20

    申请人： National Taiwan University

    发明人： LIANG-CHIA CHEN ,  JIUN-DA LIN

    IPC分类号： G02B21/06 ,  G02B21/00

    CPC分类号： G02B21/0068 ,  G01B9/02036 ,  G01B9/02042 ,  G01B9/04 ,  G01N21/9501 ,  G01N2223/6116 ,  G01N2291/2697 ,  G02B21/0016 ,  G02B21/0032 ,  G02B21/006 ,  G02B21/0064 ,  G02B21/0072

    摘要： A differential filtering chromatic confocal microscopic system comprises a chromatic dispersion objective for receiving and axially dispersing a broadband light from a light source and projecting dispersed lights onto an object thereby forming an object light reflected therefrom; an optical modulation module for dividing the object light into a first and a second object lights; a pair of optical intensity sensing module, respectively having a spatial filter with a different pinhole diameter or a slit width from each other, for detecting the first and second object lights, thereby obtaining a plurality of first and second optical intensity signals; and a signal processor for respectively processing the plurality of first and second optical intensity signals thereby obtaining a plurality of differential rational values of optical intensity and determining a corresponding object depth associated with each differential rational value according to a relation between signal intensity ratio and object surface depth.

    摘要翻译： 差分滤波彩色共焦显微系统包括色散物镜，用于接收和轴向分散来自光源的宽带光并将分散的光投射到物体上，从而形成从其反射的物体光; 用于将目标光分成第一和第二物体光的光调制模块; 一对光强度感测模块，分别具有彼此不同的针孔直径或狭缝宽度的空间滤波器，用于检测第一和第二对象光，从而获得多个第一和第二光强度信号; 以及信号处理器，用于分别处理多个第一和第二光强度信号，从而获得光强度的多个差分有理值，并根据信号强度比和物体表面之间的关系确定与每个差分有理值相关联的对应物体深度 深度。

    METHOD AND APPARATUS FOR INTERFEROMETRY
    6.
    发明申请
    METHOD AND APPARATUS FOR INTERFEROMETRY 失效
    用于干涉的方法和装置

    公开(公告)号：US20110235045A1

    公开(公告)日：2011-09-29

    申请号：US13123546

    申请日：2009-10-12

    申请人： Klaus Koerner ,  Wolfgang Osten

    发明人： Klaus Koerner ,  Wolfgang Osten

    IPC分类号： G01J3/45

    CPC分类号： G01B9/02004 ,  G01B9/02008 ,  G01B9/02036 ,  G01B9/02042 ,  G01B9/02057 ,  G01B9/02091 ,  G01B2210/50 ,  G01B2290/25 ,  G01B2290/30 ,  G02B21/0056

    摘要： A method and an arrangement are provided for scalable confocal interferometry for distance measurement, for 3-D detection of an object, for OC tomography with an object imaging interferometer and at least one light source. The interferometer has an optical path difference not equal to zero at each optically detected object element. Thus, the maxima of a sinusoidal frequency wavelet, associated with each detected object element, each have a frequency difference Δf_Objekt. At least one spectrally integrally detecting, rastered detector is arranged to record the object. The light source preferably has a frequency comb, and the frequency comb differences Δf_Quelle are changed in a predefined manner over time in a scan during measuring. In the process, the frequency differences Δf_Quelle are made equal to the frequency difference Δf_Objekt or equal to an integer multiple of the frequency differences Δf_Objekt at least once for each object element.

    摘要翻译： 提供了一种用于距离测量的可缩放共焦干涉测量的方法和装置，用于物体的三维检测，用于物体成像干涉仪和至少一个光源的OC断层摄影。 干涉仪在每个光学检测的物体元件处具有不等于零的光程差。 因此，与每个检测到的对象元素相关联的正弦频率小波的最大值各自具有频率差Dgr; f_Objekt。 至少一个光谱整体检测，被检测器被配置成记录物体。 光源优选地具有频率梳，并且在测量期间的扫描中，频率梳差异和Dgr; f_Quelle以预定的方式随时间改变。 在此过程中，使频率差Dgr; f_Quelle等于频率差Dgr; f_Objekt或者等于每个对象元素至少一次的频率差Dgr; f_Objekt的整数倍。

    Material-working device with in-situ measurement of the working distance
    8.
    发明授权
    Material-working device with in-situ measurement of the working distance 有权
    材料加工设备，具有原位测量工作距离

    公开(公告)号：US08982339B2

    公开(公告)日：2015-03-17

    申请号：US13667809

    申请日：2012-11-02

    申请人： Precitec Optronik GmbH

    发明人： Martin Schönleber ,  Markus Kogel-Hollacher

    IPC分类号： G01B11/14 ,  G01N21/25 ,  B23K26/03 ,  B23K26/04 ,  B23K26/08 ,  G01B9/02

    CPC分类号： G01N21/255 ,  B23K26/032 ,  B23K26/048 ,  B23K26/082 ,  G01B9/02007 ,  G01B9/02036 ,  G01B9/02044 ,  G01B9/02063 ,  G01B9/02091 ,  G01B2290/70

    摘要： A material-working device with working beams of a beam generator and with in-situ measurement of a working distance between the beam generator and a workpiece, the material-working device including a working laser; a laser scanner for the working laser, the laser scanner including a two-dimensional deflecting device with scanner mirrors and a variable refocusing device at varying working distances; and a sensor device including a spectrometer and at least one sensor light source, wherein measuring beams together scan a working area of the workpiece by the laser scanner and an objective lens while gathering the working distance, and the measuring beams of at least two of the light sources of the sensor device being linearly polarized and being coupled into a working beam path of the laser scanner of the material-working device by an optical coupling element in a collimated state with crossed polarization directions.

    摘要翻译： 一种材料加工装置，其具有光束发生器的工作光束，并且原位测量光束发生器和工件之间的工作距离，所述材料加工装置包括工作激光器; 用于工作激光的激光扫描器，激光扫描仪包括具有扫描仪反射镜的二维偏转装置和在不同工作距离的可变重聚焦装置; 以及包括光谱仪和至少一个传感器光源的传感器装置，其中测量光束一起在聚集工作距离的同时由激光扫描仪和物镜扫描工件的工作区域，并且测量光束的至少两个 传感器装置的光源线性偏振，并通过具有交叉偏振方向的准直状态的光耦合元件耦合到材料加工装置的激光扫描器的工作光束路径中。

    Method and apparatus for interferometry
    9.
    发明授权
    Method and apparatus for interferometry 失效
    用于干涉测量的方法和装置

    公开(公告)号：US08605289B2

    公开(公告)日：2013-12-10

    申请号：US13123546

    申请日：2009-10-12

    申请人： Klaus Koerner ,  Wolfgang Osten

    发明人： Klaus Koerner ,  Wolfgang Osten

    IPC分类号： G01B9/02

    CPC分类号： G01B9/02004 ,  G01B9/02008 ,  G01B9/02036 ,  G01B9/02042 ,  G01B9/02057 ,  G01B9/02091 ,  G01B2210/50 ,  G01B2290/25 ,  G01B2290/30 ,  G02B21/0056

    摘要： A method and an arrangement are provided for scalable confocal interferometry for distance measurement, for 3-D detection of an object, for Optical Coherence Tomography (OCT) tomography with an object imaging interferometer and at least one light source. The interferometer has an optical path difference not equal to zero at each optically detected object element. Thus, the maxima of a sinusoidal frequency wavelet, associated with each detected object element, each have a frequency difference Δf_Object. At least one spectrally integrally detecting, rastered detector is arranged to record the object. The light source preferably has a frequency comb, and the frequency comb differences Δf_Source are changed in a predefined manner over time in a scan during measuring. In the process, the frequency differences Δf_Source are made equal to the frequency difference Δf_Object or equal to an integer multiple of the frequency differences Δf_Object at least once for each object element.

    摘要翻译： 提供了一种用于距离测量的可伸缩共焦干涉测量的方法和装置，用于对象的三维检测，用于具有对象成像干涉仪和至少一个光源的光学相干断层扫描（OCT）层析成像。 干涉仪在每个光学检测的物体元件处具有不等于零的光程差。 因此，与每个检测到的对象元素相关联的正弦频率小波的最大值各自具有频差Deltaf_Object。 至少一个光谱整体检测，被检测器被配置成记录物体。 光源优选地具有频率梳，并且频率梳差Deltaf_Source在测量期间在扫描中以预定的方式随时间改变。 在此过程中，使差分Deltaf_Source与频率差Deltaf_Object相等，或等于每个对象元素至少一次频差Deltaf_Object的整数倍。

    MATERIAL-WORKING DEVICE WITH IN-SITU MEASUREMENT OF THE WORKING DISTANCE
    10.
    发明申请
    MATERIAL-WORKING DEVICE WITH IN-SITU MEASUREMENT OF THE WORKING DISTANCE 有权
    具有工作距离的现场测量的材料工作装置

    公开(公告)号：US20130120740A1

    公开(公告)日：2013-05-16

    申请号：US13667809

    申请日：2012-11-02

    申请人： PRECITEC OPTRONIK GMBH

    发明人： Martin Schönleber

    IPC分类号： G01N21/25

    CPC分类号： G01N21/255 ,  B23K26/032 ,  B23K26/048 ,  B23K26/082 ,  G01B9/02007 ,  G01B9/02036 ,  G01B9/02044 ,  G01B9/02063 ,  G01B9/02091 ,  G01B2290/70

    摘要： A material-working device with working beams of a beam generator and with in-situ measurement of a working distance between the beam generator and a workpiece, the material-working device including a working laser; a laser scanner for the working laser, the laser scanner including a two-dimensional deflecting device with scanner mirrors and a variable refocusing device at varying working distances; and a sensor device including a spectrometer and at least one sensor light source, wherein measuring beams together scan a working area of the workpiece by the laser scanner and an objective lens while gathering the working distance, and the measuring beams of at least two of the light sources of the sensor device being linearly polarised and being coupled into a working beam path of the laser scanner of the material-working device by an optical coupling element in a collimated state with crossed polarisation directions.

    摘要翻译： 一种材料加工装置，其具有光束发生器的工作光束，并且原位测量光束发生器和工件之间的工作距离，所述材料加工装置包括工作激光器; 用于工作激光的激光扫描器，激光扫描仪包括具有扫描仪反射镜的二维偏转装置和在不同工作距离的可变重聚焦装置; 以及包括光谱仪和至少一个传感器光源的传感器装置，其中测量光束一起在聚集工作距离的同时由激光扫描仪和物镜扫描工件的工作区域，并且测量光束的至少两个 传感器装置的光源线性偏振，并通过具有交叉偏振方向的准直状态的光耦合元件耦合到材料加工装置的激光扫描器的工作光束路径中。