公开(公告)号：US20230093973A1

公开(公告)日：2023-03-30

申请号：US17955939

申请日：2022-09-29

申请人： AMETEK, INC.

发明人： Norman Kupzak ,  James A. Salomon ,  Andre Stark ,  Max Fredrich

IPC分类号： G01N11/14

摘要： Devices, methods, and non-transitory computer readable media for measuring properties of a material are disclosed. A device is configured to automatically identify a property of the material such as a surface of the material as a measuring head of a spindle engages the material as the spindle is lowered. After the material surface is identified, the device is configured to automatically lower the measuring head to a predefined depth within the material with respect to the material surface. The device may measure another property of the material such as a rheological property with the measuring head at the predefined depth. The device may change the depth of the measuring head during measurement of the rheological property.