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公开(公告)号:US20230093973A1
公开(公告)日:2023-03-30
申请号:US17955939
申请日:2022-09-29
申请人: AMETEK, INC.
发明人: Norman Kupzak , James A. Salomon , Andre Stark , Max Fredrich
IPC分类号: G01N11/14
摘要: Devices, methods, and non-transitory computer readable media for measuring properties of a material are disclosed. A device is configured to automatically identify a property of the material such as a surface of the material as a measuring head of a spindle engages the material as the spindle is lowered. After the material surface is identified, the device is configured to automatically lower the measuring head to a predefined depth within the material with respect to the material surface. The device may measure another property of the material such as a rheological property with the measuring head at the predefined depth. The device may change the depth of the measuring head during measurement of the rheological property.