Abstract:
A method and apparatus for conducting a transition test of a source synchronous interface is disclosed. A system includes a source synchronous transmitter and source synchronous receiver. The source synchronous transmitter includes a first scannable flop having an output coupled to a data input of a second scannable flop in the source synchronous receiver. During a transition test, the source synchronous transmitter is configured to transmit data from the first scannable flop to the second scannable flop, along with a clock signal at an operational clock speed. The first scannable flop is coupled to feedback circuitry configured to cause transitions of the transmitted data. The second scannable flop may capture the transmitted data. The captured data may be subsequently used to determine if the desired transitions were detected by the second scannable flop.
Abstract:
A method and apparatus for conducting a transition test of a source synchronous interface is disclosed. A system includes a source synchronous transmitter and source synchronous receiver. The source synchronous transmitter includes a first scannable flop having an output coupled to a data input of a second scannable flop in the source synchronous receiver. During a transition test, the source synchronous transmitter is configured to transmit data from the first scannable flop to the second scannable flop, along with a clock signal at an operational clock speed. The first scannable flop is coupled to feedback circuitry configured to cause transitions of the transmitted data. The second scannable flop may capture the transmitted data. The captured data may be subsequently used to determine if the desired transitions were detected by the second scannable flop.
Abstract:
An apparatus and method for controlling a test controller is disclosed. An apparatus includes test controllers of a first type configured to operate according to a first protocol and test controllers of a second type configured to operate according to a second protocol. A test controller of the second type may be associated with one of the test controllers of the first type, with the former controlling the latter. The test controllers of the second type may each control associated ones of the test controllers of the second type in parallel and independently of one another.