公开(公告)号：US20240393262A1

公开(公告)日：2024-11-28

申请号：US18201927

申请日：2023-05-25

Applicant: APPLIED MATERIALS, INC.

Inventor： Jeong Jin Hong ,  Sejune Cheon ,  Sang Hong Kim ,  Thomas Ho Fai Li ,  Anders Andelman Nottrott ,  Zhaozhao Zhu ,  MiHyun Jang

IPC: G01N21/95 ,  G06T7/00

Abstract: A method includes receiving spectral data of a substrate and metrology data corresponding to the spectral data of the substrate. The method further includes determining a plurality of feature model configurations for each of a plurality of feature models, each of the plurality of feature model configurations including one or more feature model conditions. The method further includes determining a plurality of feature model combinations, where each feature model combination of the plurality of feature model combinations includes a subset of the plurality of feature model configurations. The method further includes generating a plurality of input datasets, where each input dataset of the plurality of input datasets is generated based on application of the spectral data to a respective feature model combination of the plurality of feature model combinations. The method further includes training a plurality of machine learning models, where each machine learning model is trained to generate an output using an input dataset of the plurality of input datasets and the metrology data. The method further includes selecting a trained machine learning model from the plurality of trained machine learning models satisfying one or more selection criteria.