Configuration tool and method for a quality control system

    公开(公告)号:US12118674B2

    公开(公告)日:2024-10-15

    申请号:US18318249

    申请日:2023-05-16

    申请人: ARKITE NV

    发明人: Ives De Saeger

    摘要: A configuration tool adapted to configure a quality control system to monitor and/or guide an operator in a working environment through recognition of objects, events or an operational process, comprises: a volumetric sensor adapted to capture volumetric image frames of the working environment while an object, event or operational process is demonstrated; a display, coupled to the volumetric sensor and configured to live display the volumetric image frames; and a processor configured to: generate a user interface in overlay of the volumetric image frames to enable a user to define a layout zone; and automatically generate a virtual box in the layout zone when an object, event or operational process is detected during demonstration of the object, event or operational process.

    Configuration tool and method for a quality control system

    公开(公告)号:US11688141B2

    公开(公告)日:2023-06-27

    申请号:US17564855

    申请日:2021-12-29

    申请人: ARKITE NV

    发明人: Ives De Saeger

    摘要: A configuration tool adapted to configure a quality control system to monitor and/or guide an operator in a working environment through recognition of objects, events or an operational process, comprises: a volumetric sensor adapted to capture volumetric image frames of the working environment while an object, event or operational process is demonstrated; a display, coupled to the volumetric sensor and configured to live display the volumetric image frames; and a processor configured to: generate a user interface in overlay of the volumetric image frames to enable a user to define a layout zone; and automatically generate a virtual box in the layout zone when an object, event or operational process is detected during demonstration of the object, event or operational process.

    Configuration tool and method for a quality control system

    公开(公告)号:US11244507B2

    公开(公告)日:2022-02-08

    申请号:US16650536

    申请日:2018-02-13

    申请人: ARKITE NV

    发明人: Ives De Saeger

    摘要: A configuration tool adapted to configure a quality control system to monitor and/or guide an operator in a working environment through recognition of objects, events or an operational process, comprises: a volumetric sensor adapted to capture volumetric image frames of the working environment while an object, event or operational process is demonstrated; a display, coupled to the volumetric sensor and configured to live display the volumetric image frames; and a processor configured to: generate a user interface in overlay of the volumetric image frames to enable a user to define a layout zone; and automatically generate a virtual box in the layout zone when an object, event or operational process is detected during demonstration of the object, event or operational process.