Multi-Tier Co-Placement for Integrated Circuitry

    公开(公告)号:US20190303523A1

    公开(公告)日:2019-10-03

    申请号:US15939047

    申请日:2018-03-28

    Applicant: Arm Limited

    Abstract: Various implementations described herein are directed to a method that defines tiers of an integrated circuit having standard cells placed adjacent to each other in a multi-tier placement. The integrated circuit includes multi-tier nets connected with inter-tier connections. The method includes pairing inter-tier connections as inter-tier-connection pairs belonging to a same net. The method includes grouping standard cells in groups with or without inter-tier-connection pairs from the tiers. The method includes relating the standard cells with or without inter-tier-connection pairs within each group from the groups by generating a multi-tier fence boundary around physical locations of the standard cells with or without inter-tier-connection pairs. The method includes iteratively adjusting a location of the standard cells with or without a location of inter-tier connections so as to converge the location of the standard cells with or without the location of the inter-tier connections to optimized or legal locations.

    Multi-tier co-placement for integrated circuitry

    公开(公告)号:US11120191B2

    公开(公告)日:2021-09-14

    申请号:US16820471

    申请日:2020-03-16

    Applicant: Arm Limited

    Abstract: Various implementations described herein are directed to a method that defines tiers of an integrated circuit having standard cells placed adjacent to each other in a multi-tier placement. The integrated circuit includes multi-tier nets connected with inter-tier connections. The method includes pairing inter-tier connections as inter-tier-connection pairs belonging to a same net. The method includes grouping standard cells in groups with or without inter-tier-connection pairs from the tiers. The method includes relating the standard cells with or without inter-tier-connection pairs within each group from the groups by generating a multi-tier fence boundary around physical locations of the standard cells with or without inter-tier-connection pairs. The method includes iteratively adjusting a location of the standard cells with or without a location of inter-tier connections so as to converge the location of the standard cells with or without the location of the inter-tier connections to optimized locations or legal locations.

    METHOD AND APPARATUS FOR ON-CHIP POWER METERING USING AUTOMATED SELECTION OF SIGNAL POWER PROXIES

    公开(公告)号:US20220163576A1

    公开(公告)日:2022-05-26

    申请号:US17218686

    申请日:2021-03-31

    Applicant: Arm Limited

    Abstract: An integrated circuit includes a first circuit and a power meter coupled to the first circuit at selected proxy locations. The power meter includes circuitry for generating toggle data, such as signal transitions or signal levels, from signals at the proxy locations and combiner circuitry for combining the toggle data in a first time window with a set of weight value to produce a measure of power usage in the first circuit. The proxy locations and weight values are selected automatically based on simulated or emulated signals from a larger set of locations in the first circuit and associated power usage in the first circuit.

    TSV Coupled Integrated Circuits and Methods

    公开(公告)号:US20220130816A1

    公开(公告)日:2022-04-28

    申请号:US17077532

    申请日:2020-10-22

    Applicant: Arm Limited

    Abstract: According to one implementation of the present disclosure, an integrated circuit includes a memory macro unit, and one or more through silicon vias (TSVs) at least partially coupled through the memory macro unit. According to one implementation of the present disclosure, a computer-readable storage medium comprising instructions that, when executed by a processor, cause the processor to perform operations including: receiving a user input corresponding to dimensions of respective pitches of one or more through silicon vias (TSVs); determining whether dimensions of a memory macro unit is greater than a size threshold, wherein the size threshold corresponds to the received user input; and determining one or more through silicon via (TSV) positionings based on the determined dimensions of the memory macro unit.

    Multi-die integrated circuits with improved testability

    公开(公告)号:US10825745B1

    公开(公告)日:2020-11-03

    申请号:US16666816

    申请日:2019-10-29

    Applicant: Arm Limited

    Abstract: A multi-die integrated circuit with improved testability can include at least two dies that combined comprise an integrated circuit for a self-contained system, which includes logic and design-for-test features. The integrated circuit is split into at least two portions, where each portion is disposed on a corresponding one of the at least two dies. As part of the improved testability for both pre-bond testing of logic and post-bond testing of inter-die connections, at least one of the at least two dies further comprises a split-circuit-boundary scan chain. An automated design tool can be used to determine optimal ways for the integrated circuit for a self-contained system to be split into at least two portions for the corresponding at least two dies. In addition, a split-circuit-boundary scan chain option can be applied for each portion, via the automated design tool, to ensure boundary scans are available on timing paths.

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