RUNOUT AND WOBBLE MEASUREMENT FIXTURES
    1.
    发明公开

    公开(公告)号:US20240218508A1

    公开(公告)日:2024-07-04

    申请号:US18609379

    申请日:2024-03-19

    CPC classification number: C23C16/455 B23Q3/00 C23C16/4582 C23C16/52

    Abstract: A fixture is provided. The fixture includes a base, a turntable, a first sensor, and a second sensor. The turntable is supported on the base, is rotatable about a rotation axis, and is configured to slidably seat a susceptor assembly for rotation about the rotation axis. The first sensor is fixed relative to the base, is radially offset from the rotation axis, and is configured to determine ex-situ runout of the susceptor assembly. The second sensor is fixed relative to the first sensor, is axially offset from the first sensor, and is configured to determine ex-situ wobble of the susceptor assembly. Fixture arrangements and methods of determining ex-situ runout and ex-situ wobble of susceptor assemblies for semiconductor processing systems are also described.

    RUNOUT AND WOBBLE MEASUREMENT FIXTURES

    公开(公告)号:US20220186369A1

    公开(公告)日:2022-06-16

    申请号:US17549022

    申请日:2021-12-13

    Abstract: A fixture is provided. The fixture includes a base, a turntable, a first sensor, and a second sensor. The turntable is supported on the base, is rotatable about a rotation axis, and is configured to slidably seat a susceptor assembly for rotation about the rotation axis. The first sensor is fixed relative to the base, is radially offset from the rotation axis, and is configured to determine ex-situ runout of the susceptor assembly. The second sensor is fixed relative to the first sensor, is axially offset from the first sensor, and is configured to determine ex-situ wobble of the susceptor assembly. Fixture arrangements and methods of determining ex-situ runout and ex-situ wobble of susceptor assemblies for semiconductor processing systems are also described.

    Runout and wobble measurement fixtures

    公开(公告)号:US11946137B2

    公开(公告)日:2024-04-02

    申请号:US17549022

    申请日:2021-12-13

    CPC classification number: C23C16/455 B23Q3/00 C23C16/4582 C23C16/52

    Abstract: A fixture is provided. The fixture includes a base, a turntable, a first sensor, and a second sensor. The turntable is supported on the base, is rotatable about a rotation axis, and is configured to slidably seat a susceptor assembly for rotation about the rotation axis. The first sensor is fixed relative to the base, is radially offset from the rotation axis, and is configured to determine ex-situ runout of the susceptor assembly. The second sensor is fixed relative to the first sensor, is axially offset from the first sensor, and is configured to determine ex-situ wobble of the susceptor assembly. Fixture arrangements and methods of determining ex-situ runout and ex-situ wobble of susceptor assemblies for semiconductor processing systems are also described.

    WAFER PROCESSING APPARATUS WITH A ROTATABLE TABLE

    公开(公告)号:US20220199444A1

    公开(公告)日:2022-06-23

    申请号:US17551586

    申请日:2021-12-15

    Abstract: The disclosure relates to a wafer processing apparatus for processing wafers with a rotatable table provided with a support constructed and arranged to support a removable holder for storing a plurality of wafers. A drive assembly may be provided to provide a rotary movement to the rotatable table around a vertical axis perpendicular to the table; and, a supply line may be constructed and arranged to supply utilities to the rotatable table. The drive assembly may be controlled and configured to create the rotary movement of the table in a clockwise and/or an anticlockwise direction to avoid breakage of the supply line.

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