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公开(公告)号:US11276614B2
公开(公告)日:2022-03-15
申请号:US16944206
申请日:2020-07-31
发明人: Shun Yan Lee , Sai Kit Wong , Chi Wah Yuen , Ka Yee Mak , Gary Peter Widdowson
摘要: A pick and place LED testing apparatus, comprising: a test station operative in use to power a group of LEDs; a bondhead operative in use to pick said group of LEDs from a source wafer and place said group of LEDs on said test station for testing; and an optical sensor operative in use to measure an optical characteristic of said group of LEDs when tested, wherein at least a portion of said bondhead is translucent to provide an optical path from said group of LEDs to said optical sensor.