公开(公告)号：US20170219939A1

公开(公告)日：2017-08-03

申请号：US15328376

申请日：2015-06-26

申请人： ASML Netherlands B.V.

发明人： Theodorus Wilhelmus POLET ,  Johannes Jacobus BASELMANS ,  Willem Jan BOUMAN ,  Han Henricus Aldegonda LEMPENS ,  Theodorus Marinus MODDERMAN ,  Cornelius Maria ROPS ,  Bart SMEETS ,  Koen STEFFENS ,  Ronald VAN DER HAM

IPC分类号： G03F7/20

CPC分类号： G03F7/70866 ,  G03F7/70341 ,  G03F7/7095

摘要： An immersion lithographic apparatus includes a projection system. The projection system is configured to project a patterned radiation beam through an immersion liquid onto a target portion of a substrate. An external surface of the projection system includes a first surface. The first surface has a non-planar shape. An element is attached to the first surface and positioned so that at least a portion of the element contacts the immersion liquid in use. The element includes a closed loop of continuously integral material in a preformed state and conforms to the non-planar shape of the first surface.