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公开(公告)号:US12288663B2
公开(公告)日:2025-04-29
申请号:US18155684
申请日:2023-01-17
Applicant: ASML Netherlands B.V.
Inventor: Laura Dinu-Gurtler , Eric Petrus Hogervorst , Jurgen Van Soest
IPC: H01J37/04 , G03F7/00 , H01J37/10 , H01J37/244 , H01J37/317 , H01L21/263
Abstract: The disclosed embodiments relate to a charged particle source module for generating and emitting a charged particle beam, such as an electron beam, comprising: a frame including a first frame part, a second frame part, and one or more rigid support members which are arranged between said first frame part and said second frame part; a charged particle source arrangement for generating a charged particle beam, such as an electron beam, wherein said charged particle source arrangement, such as an electron source, is arranged at said second frame part; and a power connecting assembly arranged at said first frame part, wherein said charged particle source arrangement is electrically connected to said connecting assembly via electrical wiring.
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公开(公告)号:US12028000B2
公开(公告)日:2024-07-02
申请号:US18132617
申请日:2023-04-10
Applicant: ASML Netherlands B.V.
Inventor: Jan-Gerard Cornelis Van Der Toorn , Jeroen Gertruda Antonius Huinck , Han Willem Hendrik Severt , Allard Eelco Kooiker , Michael Johannes Christiaan Ronde , Arno Maria Wellink , Shibing Liu , Ying Luo , Yixiang Wang , Chia-Yao Chen , Bohang Zhu , Jurgen Van Soest
CPC classification number: H02N13/00 , G03F7/70708 , G03F7/70716
Abstract: Disclosed is an object table for holding an object, comprising: an electrostatic clamp arranged to clamp the object on the object table; a neutralizer arranged to neutralize a residual charge of the electrostatic clamp; a control unit arranged to control the neutralizer, wherein the residual charge is an electrostatic charge present on the electrostatic clamp when no voltage is applied to the electrostatic clamp.
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公开(公告)号:US11637512B2
公开(公告)日:2023-04-25
申请号:US17351181
申请日:2021-06-17
Applicant: ASML Netherlands B.V.
Inventor: Jan-Gerard Cornelis Van Der Toorn , Jeroen Gertruda Antonius Huinck , Han Willem Hendrik Severt , Allard Eelco Kooiker , Michaël Johannes Christiaan Ronde , Arno Maria Wellink , Shibing Liu , Ying Luo , Yixiang Wang , Chia-Yao Chen , Bohang Zhu , Jurgen Van Soest
Abstract: Disclosed is an object table for holding an object, comprising: an electrostatic clamp arranged to clamp the object on the object table; a neutralizer arranged to neutralize a residual charge of the electrostatic clamp; a control unit arranged to control the neutralizer, wherein the residual charge is an electrostatic charge present on the electrostatic clamp when no voltage is applied to the electrostatic clamp.
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公开(公告)号:US11557455B2
公开(公告)日:2023-01-17
申请号:US16600364
申请日:2019-10-11
Applicant: ASML Netherlands B.V.
Inventor: Laura Dinu-Gurtler , Eric Petrus Hogervorst , Jurgen Van Soest
IPC: H01J37/04 , H01J37/10 , G03F7/20 , H01J37/244 , H01J37/317 , H01L21/263
Abstract: The disclosed embodiments relate to a charged particle source module for generating and emitting a charged particle beam, such as an electron beam, comprising: a frame including a first frame part, a second frame part, and one or more rigid support members which are arranged between said first frame part and said second frame part; a charged particle source arrangement for generating a charged particle beam, such as an electron beam, wherein said charged particle source arrangement, such as an electron source, is arranged at said second frame part; and a power connecting assembly arranged at said first frame part, wherein said charged particle source arrangement is electrically connected to said connecting assembly via electrical wiring.
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