公开(公告)号：US11493482B2

公开(公告)日：2022-11-08

申请号：US16337712

申请日：2017-10-03

Applicant: AUGURY SYSTEMS LTD.

Inventor： Eduard Rudyk ,  Ori Negri ,  Gal Shaul ,  Saar Yoskovitz

IPC: G01N29/14 ,  G01H1/00 ,  G01N29/44

Abstract: A system for monitoring and identifying states of a semiconductor device, the system including at least one acoustic sensor for sensing acoustic emission emitted by at least one semiconductor device operating at a voltage of less than or equal to 220 V, the at least one acoustic sensor outputting at least one acoustic emission signal and a signal processing unit for receiving the at least one acoustic emission signal from the at least one acoustic sensor and for analyzing the at least one acoustic emission signal, the signal processing unit providing an output based on the analyzing, the output being indicative at least of whether the at least one semiconductor device is in an abnormal operating state with respect to a normal operating state of the semiconductor device.

公开(公告)号：US11493379B2

公开(公告)日：2022-11-08

申请号：US16608563

申请日：2018-04-09

Applicant: Augury Systems Ltd.

Inventor： Saar Yoskovitz ,  Gal Shaul ,  Ori Negri ,  Eduard Rudyk ,  Gal Ben-Haim

IPC: G01H1/00 ,  G01H1/04 ,  G01R33/02 ,  G05B23/02

Abstract: A system for monitoring at least one machine including a plurality of magnetic sensors synchronously sensing magnetic fields emitted by at least one machine, along a corresponding plurality of channels and outputting magnetic field emission signals corresponding to the magnetic fields, a signal analyzer receiving at least a portion of the magnetic field emission signals, performing analysis thereof, and providing an output based on the analysis, the output including at least an indication of a condition of the at least one machine, and a control module receiving the indication of the condition and initiating at least one of a repair event on the at least one machine, an adjustment to a maintenance schedule of the at least one machine and an adjustment to an operating parameter of the at least one machine based on the indication, whereby efficacy of the at least one machine is improved.

公开(公告)号：US11977053B2

公开(公告)日：2024-05-07

申请号：US18312440

申请日：2023-05-04

Applicant: AUGURY SYSTEMS LTD.

Inventor： Eduard Rudyk ,  Ori Negri ,  Gal Shaul ,  Saar Yoskovitz

IPC: G01N29/14 ,  G01H1/00 ,  G01N29/44

CPC classification number: G01N29/14 ,  G01H1/00 ,  G01N29/4427 ,  G01N29/4436 ,  G01N2291/2697

Abstract: A system for monitoring and identifying states of a semiconductor device, the system including at least one acoustic sensor for sensing acoustic emission emitted by at least one semiconductor device operating at a voltage of less than or equal to 220 V, the at least one acoustic sensor outputting at least one acoustic emission signal and a signal processing unit for receiving the at least one acoustic emission signal from the at least one acoustic sensor and for analyzing the at least one acoustic emission signal, the signal processing unit providing an output based on the analyzing, the output being indicative at least of whether the at least one semiconductor device is in an abnormal operating state with respect to a normal operating state of the semiconductor device.

公开(公告)号：US11885667B2

公开(公告)日：2024-01-30

申请号：US17934395

申请日：2022-09-22

Applicant: Augury Systems Ltd.

Inventor： Saar Yoskovitz ,  Gal Shaul ,  Ori Negri ,  Eduard Rudyk ,  Gal Ben-Haim

IPC: G01H1/00 ,  G01H1/04 ,  G01R33/02 ,  G05B23/02

CPC classification number: G01H1/003 ,  G01H1/04 ,  G01R33/02 ,  G05B23/0283

Abstract: A system for continuously monitoring at least one machine including at least one magnetic sensor sensing magnetic fields emitted by at least one machine, at least one vibration sensor synchronously sensing vibrations emitted by the at least one machine, a signal analyzer receiving at least a portion of the magnetic field emission signals and vibration signals and performing analysis thereof, the signal analyzer providing an output based on the analysis, the output including at least an indication of a condition of the at least one machine, and a control module initiating at least one of a repair event on the at least one machine, an adjustment to a maintenance schedule of the at least one machine and an adjustment to an operating parameter of the at least one machine based on the indication, whereby efficacy of the at least one machine is improved.