Automated analysis of non-stationary machine performance

    公开(公告)号:US11934184B2

    公开(公告)日:2024-03-19

    申请号:US18078320

    申请日:2022-12-09

    CPC classification number: G05B23/0283 G01M13/00 G05B23/0254

    Abstract: A method for machine monitoring including causing a first sensor to acquire at least a first non-stationary signal from at least one machine operating in a non-stationary manner during at least one operational time frame, causing a second sensor to acquire at least a second non-stationary signal from the at least one machine during the operational time frame, fusing a first non-stationary output provided by the first sensor with a second non-stationary output provided by the second sensor, extracting at least one feature from the fused output, analyzing the at least one feature to ascertain a state of health of the at least one machine and performing at least one operation on the at least one machine based on the state of health as found by the analyzing.

    Automatic mechanical systems diagnosis

    公开(公告)号:US11579122B2

    公开(公告)日:2023-02-14

    申请号:US17205118

    申请日:2021-03-18

    Abstract: A method for automatic diagnosis of a mechanical system of a group of mechanical systems sharing mechanical characteristics includes obtaining data relating to a vibration. The vibration-related data is acquired by a portable communications device configured to communicate with a remote processor. The processor automatically diagnoses the mechanical system by applying a relationship to the obtained vibration-related data. The relationship is based on sets of vibration-related data previously obtained from the mechanical systems. Each set of vibration-related data relates to vibrations of a mechanical system. The relationship is further based on sets of operation data previously obtained for mechanical systems of the group. Each set of operation data indicates a previous state of operation of a mechanical system. Each of the previous states of operation is associated with at least one of the previously obtained sets of vibration-related data.

    Systems and methods for monitoring of mechanical and electrical machines

    公开(公告)号:US11493379B2

    公开(公告)日:2022-11-08

    申请号:US16608563

    申请日:2018-04-09

    Abstract: A system for monitoring at least one machine including a plurality of magnetic sensors synchronously sensing magnetic fields emitted by at least one machine, along a corresponding plurality of channels and outputting magnetic field emission signals corresponding to the magnetic fields, a signal analyzer receiving at least a portion of the magnetic field emission signals, performing analysis thereof, and providing an output based on the analysis, the output including at least an indication of a condition of the at least one machine, and a control module receiving the indication of the condition and initiating at least one of a repair event on the at least one machine, an adjustment to a maintenance schedule of the at least one machine and an adjustment to an operating parameter of the at least one machine based on the indication, whereby efficacy of the at least one machine is improved.

    Sensor-agnostic mechanical machine fault identification

    公开(公告)号:US11853047B2

    公开(公告)日:2023-12-26

    申请号:US17639795

    申请日:2020-09-03

    CPC classification number: G05B23/024 G05B23/0281 G05B23/0283

    Abstract: A method for identifying a fault of at least one mechanical machine, including causing a first plurality of sensors coupled to a corresponding first plurality of mechanical machines to acquire a first plurality of sets of signals emanating from the first plurality of mechanical machines, the first plurality of mechanical machines sharing at least one characteristic, supplying at least the first plurality of sets of signals of the first plurality of mechanical machines to a pre-existing fault classifier previously trained to automatically identify faults of a second plurality of mechanical machines based on signals emanating therefrom and previously acquired by a second plurality of sensors, the second plurality of sensors being of a different type than the first plurality of sensors, the second plurality of mechanical machines sharing the at least one characteristic, modifying the pre-existing fault classifier by employing transfer learning, based at least on the first plurality of sets of signals of the first plurality of mechanical machines, thereby providing a modified fault classifier, applying the modified fault classifier to at least one additional set of signals acquired by at least one sensor of the first plurality of sensors and emanating from at least one given mechanical machine sharing the at least one characteristic, the modified fault classifier being configured to automatically identify at least one fault of the at least one given mechanical machine based on the at least one additional set of signals, and providing a human sensible output, by an output device, including at least identification of the fault of the at least one given mechanical machine, at least one of a repair or maintenance operation being performed based on the human sensible output.

    Automated analysis of non-stationary machine performance

    公开(公告)号:US11556121B2

    公开(公告)日:2023-01-17

    申请号:US17291849

    申请日:2019-11-07

    Abstract: A method for monitoring at least one machine including causing at least a first sensor to acquire at least a first non-stationary signal from at least one machine operating in a non-stationary manner during at least one operational time frame, the at least first sensor providing at least a first non-stationary output, causing at least a second sensor to acquire at least a second non-stationary signal from the at least one machine during the operational time frame, the at least second sensor providing at least a second non-stationary output, fusing the at least first non-stationary output with the at least second non-stationary output to produce a fused output, extracting at least one feature of at least one of the first and second non-stationary signals based on the fused output, analyzing the at least one feature to ascertain a state of health of the at least one machine and performing at least one of a repair operation, maintenance operation and modification of operating parameters of the at least one machine based on the state of health as found by the analyzing.

    AUTOMATIC MECHANICAL SYSTEM DIAGNOSIS
    6.
    发明申请
    AUTOMATIC MECHANICAL SYSTEM DIAGNOSIS 有权
    自动机械系统诊断

    公开(公告)号:US20140114612A1

    公开(公告)日:2014-04-24

    申请号:US13657037

    申请日:2012-10-22

    Abstract: A method for automatic diagnosis of a mechanical system of a group of mechanical systems sharing mechanical characteristics includes obtaining data relating to a vibration. The vibration-related data is acquired by a portable communications device configured to communicate with a remote processor. The processor automatically diagnoses the mechanical system by applying a relationship to the obtained vibration-related data. The relationship is based on sets of vibration-related data previously obtained from the mechanical systems. Each set of vibration-related data relates to vibrations of a mechanical system. The relationship is further based on sets of operation data previously obtained for mechanical systems of the group. Each set of operation data indicates a previous state of operation of a mechanical system. Each of the previous states of operation is associated with at least one of the previously obtained sets of vibration-related data.

    Abstract translation: 一种用于自动诊断一组共享机械特性的机械系统的机械系统的方法包括获得与振动有关的数据。 振动相关数据由被配置为与远程处理器进行通信的便携式通信设备获取。 处理器通过应用与获得的振动相关数据的关系来自动诊断机械系统。 该关系基于先前从机械系统获得的振动相关数据集合。 每组振动相关数据都涉及机械系统的振动。 该关系还基于先前为该组的机械系统获得的操作数据集。 每组操作数据表示机械系统的先前操作状态。 先前的操作状态中的每一个与先前获得的振动相关数据集中的至少一个相关联。

    Systems and methods for acoustic emission monitoring of semiconductor devices

    公开(公告)号:US11493482B2

    公开(公告)日:2022-11-08

    申请号:US16337712

    申请日:2017-10-03

    Abstract: A system for monitoring and identifying states of a semiconductor device, the system including at least one acoustic sensor for sensing acoustic emission emitted by at least one semiconductor device operating at a voltage of less than or equal to 220 V, the at least one acoustic sensor outputting at least one acoustic emission signal and a signal processing unit for receiving the at least one acoustic emission signal from the at least one acoustic sensor and for analyzing the at least one acoustic emission signal, the signal processing unit providing an output based on the analyzing, the output being indicative at least of whether the at least one semiconductor device is in an abnormal operating state with respect to a normal operating state of the semiconductor device.

    Automatic mechanical systems diagnosis

    公开(公告)号:US10983097B2

    公开(公告)日:2021-04-20

    申请号:US16402722

    申请日:2019-05-03

    Abstract: A method for automatic diagnosis of a mechanical system of a group of mechanical systems sharing mechanical characteristics includes obtaining data relating to a vibration. The vibration-related data is acquired by a portable communications device configured to communicate with a remote processor. The processor automatically diagnoses the mechanical system by applying a relationship to the obtained vibration-related data. The relationship is based on sets of vibration-related data previously obtained from the mechanical systems. Each set of vibration-related data relates to vibrations of a mechanical system. The relationship is further based on sets of operation data previously obtained for mechanical systems of the group. Each set of operation data indicates a previous state of operation of a mechanical system. Each of the previous states of operation is associated with at least one of the previously obtained sets of vibration-related data.

    Systems and methods for acoustic emission monitoring of semiconductor devices

    公开(公告)号:US11977053B2

    公开(公告)日:2024-05-07

    申请号:US18312440

    申请日:2023-05-04

    Abstract: A system for monitoring and identifying states of a semiconductor device, the system including at least one acoustic sensor for sensing acoustic emission emitted by at least one semiconductor device operating at a voltage of less than or equal to 220 V, the at least one acoustic sensor outputting at least one acoustic emission signal and a signal processing unit for receiving the at least one acoustic emission signal from the at least one acoustic sensor and for analyzing the at least one acoustic emission signal, the signal processing unit providing an output based on the analyzing, the output being indicative at least of whether the at least one semiconductor device is in an abnormal operating state with respect to a normal operating state of the semiconductor device.

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