公开(公告)号：US20240271927A1

公开(公告)日：2024-08-15

申请号：US18693502

申请日：2022-09-20

Applicant: Agency for Science, Technology and Research

Inventor： Hai Sheng LEONG ,  Lin KE ,  Nan ZHANG ,  Qing Yang Steve WU ,  Sergey GORELIK ,  Hong LIU ,  Chun Yong Andrew NGO

IPC: G01B11/06

CPC classification number: G01B11/0625

Abstract: A paint thickness measuring device and a computer-implemented method for measuring paint thickness using the same are provided. The paint thickness measuring device includes a first continuous-wave (cw) laser, a second continuous-wave laser, a photomixer, one or more computer processors, and a non-transitory computer-readable memory. The photomixer includes an optical coupler configured to mix laser lights emitted by the first and second continuous-wave lasers and generate a terahertz (THz) wave, a photomixer emitter configured to emit the terahertz wave, and a photomixer receiver configured to detect the terahertz wave reflected off a painted surface. The non-transitory computer-readable memory stores computer program instructions executable by the one or more computer processors to perform operations for paint thickness measurement. The operations include: comparing the detected terahertz wave to simulation results, identifying a minimum difference between the detected terahertz wave and the simulation results, and determining a paint thickness of the painted surface from the simulation results with the minimum difference.