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公开(公告)号:US20130197862A1
公开(公告)日:2013-08-01
申请号:US13362238
申请日:2012-01-31
申请人: Aleksandar Uzelac , David A. Stevens , Andrey B. Batchvarov , Changsin Lee , Takahiro Shigemitsu
发明人: Aleksandar Uzelac , David A. Stevens , Andrey B. Batchvarov , Changsin Lee , Takahiro Shigemitsu
IPC分类号: G06F11/30
CPC分类号: G06F3/0418 , G06F3/041
摘要: Panning latency measurement techniques are described. In one or more implementations, a test apparatus includes one or more motors configured to move one or more contacts at least proximal to one or more sensors of a device to be detectable as a movement. The test apparatus also includes one or more modules implemented at least partially in hardware to measure latency of the device to recognize the movement of the one or more contacts.
摘要翻译: 描述了平移延迟测量技术。 在一个或多个实施方案中,测试装置包括一个或多个电动机,其配置成将至少近端的一个或多个触点移动到设备的一个或多个传感器以作为运动被检测。 测试设备还包括至少部分地在硬件中实现的一个或多个模块,以测量设备识别一个或多个触点的移动的延迟。
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公开(公告)号:US08914254B2
公开(公告)日:2014-12-16
申请号:US13362238
申请日:2012-01-31
申请人: Aleksandar Uzelac , David A. Stevens , Andrey B. Batchvarov , Changsin Lee , Takahiro Shigemitsu
发明人: Aleksandar Uzelac , David A. Stevens , Andrey B. Batchvarov , Changsin Lee , Takahiro Shigemitsu
CPC分类号: G06F3/0418 , G06F3/041
摘要: Panning latency measurement techniques are described. In one or more implementations, a test apparatus includes one or more motors configured to move one or more contacts at least proximal to one or more sensors of a device to be detectable as a movement. The test apparatus also includes one or more modules implemented at least partially in hardware to measure latency of the device to recognize the movement of the one or more contacts.
摘要翻译: 描述了平移延迟测量技术。 在一个或多个实施方案中,测试装置包括一个或多个电动机,其配置成将至少近端的一个或多个触点移动到设备的一个或多个传感器以作为运动被检测。 测试设备还包括至少部分地在硬件中实现的一个或多个模块,以测量设备识别一个或多个触点的移动的延迟。
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公开(公告)号:US09030437B2
公开(公告)日:2015-05-12
申请号:US13205319
申请日:2011-08-08
申请人: Aleksandar Uzelac , David A. Stevens , Weidong Zhao , Takahiro Shigemitsu , Briggs A. Willoughby , John Graham Pierce , Pravin Kumar Santiago , Craig S. Ranta , Timothy Allen Wright , Jeffrey C. Maier , Robert T. Perry , Stanimir Naskov Kirilov , Andrey B. Batchvarov
发明人: Aleksandar Uzelac , David A. Stevens , Weidong Zhao , Takahiro Shigemitsu , Briggs A. Willoughby , John Graham Pierce , Pravin Kumar Santiago , Craig S. Ranta , Timothy Allen Wright , Jeffrey C. Maier , Robert T. Perry , Stanimir Naskov Kirilov , Andrey B. Batchvarov
CPC分类号: G06F3/0418 , G06F3/044 , G06F11/2221
摘要: Touchscreen testing techniques are described. In one or more implementations, a piece of conductor (e.g., metal) is positioned as proximal to a touchscreen device and the touchscreen device is tested by simulating a touch of a user. This technique may be utilized to perform a variety of different testing of a touchscreen device, such as to test latency and probabilistic latency. Additional techniques are also described including contact geometry testing techniques.
摘要翻译: 描述了触摸屏测试技术。 在一个或多个实现中,一片导体(例如,金属)被定位成接近触摸屏设备,并且通过模拟用户的触摸来测试触摸屏设备。 该技术可以用于执行触摸屏设备的各种不同的测试,例如测试延迟和概率等待时间。 还描述了附加技术,包括接触几何测试技术。
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公开(公告)号:US20120188197A1
公开(公告)日:2012-07-26
申请号:US13205319
申请日:2011-08-08
申请人: Aleksandar Uzelac , David A. Stevens , Weidong Zhao , Takahiro Shigemitsu , Briggs A. Willoughby , John Graham Pierce , Pravin Kumar Santiago , Craig S. Ranta , Timothy Allen Wright , Jeffrey C. Maier , Robert T. Perry , Stanimir Naskov Kirilov , Andrey B. Batchvarov
发明人: Aleksandar Uzelac , David A. Stevens , Weidong Zhao , Takahiro Shigemitsu , Briggs A. Willoughby , John Graham Pierce , Pravin Kumar Santiago , Craig S. Ranta , Timothy Allen Wright , Jeffrey C. Maier , Robert T. Perry , Stanimir Naskov Kirilov , Andrey B. Batchvarov
CPC分类号: G06F3/0418 , G06F3/044 , G06F11/2221
摘要: Touchscreen testing techniques are described. In one or more implementations, a piece of conductor (e.g., metal) is positioned as proximal to a touchscreen device and the touchscreen device is tested by simulating a touch of a user. This technique may be utilized to perform a variety of different testing of a touchscreen device, such as to test latency and probabilistic latency. Additional techniques are also described including contact geometry testing techniques.
摘要翻译: 描述了触摸屏测试技术。 在一个或多个实现中,一片导体(例如,金属)被定位成接近触摸屏设备,并且通过模拟用户的触摸来测试触摸屏设备。 该技术可以用于执行触摸屏设备的各种不同的测试,例如测试延迟和概率等待时间。 还描述了附加技术,包括接触几何测试技术。
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公开(公告)号:US08725443B2
公开(公告)日:2014-05-13
申请号:US13198415
申请日:2011-08-04
申请人: Aleksandar Uzelac , David A. Stevens , Weidong Zhao , Takahiro Shigemitsu , Briggs A. Willoughby , John Graham Pierce , Pravin Kumar Santiago , Craig S. Ranta , Timothy Allen Wright , Jeffrey C. Maier , Robert T. Perry , Stanimir Naskov Kirilov
发明人: Aleksandar Uzelac , David A. Stevens , Weidong Zhao , Takahiro Shigemitsu , Briggs A. Willoughby , John Graham Pierce , Pravin Kumar Santiago , Craig S. Ranta , Timothy Allen Wright , Jeffrey C. Maier , Robert T. Perry , Stanimir Naskov Kirilov
IPC分类号: G01R25/00
CPC分类号: G06F3/0418 , G06F3/044 , G06F11/2221
摘要: Touchscreen testing techniques are described. In one or more implementations, a piece of conductor (e.g., metal) is positioned as proximal to a touchscreen device and the touchscreen device is tested by simulating a touch of a user. This technique may be utilized to perform a variety of different testing of a touchscreen device, such as to test latency and probabilistic latency. Additional techniques are also described including contact geometry testing techniques.
摘要翻译: 描述了触摸屏测试技术。 在一个或多个实现中,一片导体(例如,金属)被定位成接近触摸屏设备,并且通过模拟用户的触摸来测试触摸屏设备。 该技术可以用于执行触摸屏设备的各种不同的测试,例如测试延迟和概率等待时间。 还描述了附加技术,包括接触几何测试技术。
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公开(公告)号:US20120188176A1
公开(公告)日:2012-07-26
申请号:US13198036
申请日:2011-08-04
申请人: Aleksandar Uzelac , David A. Stevens , Weidong Zhao , Takahiro Shigemitsu , Briggs A. Willoughby , John Graham Pierce , Pravin Kumar Santiago , Craig S. Ranta , Timothy Allen Wright , Jeffrey C. Maier , Robert T. Perry , Stanimir Naskov Kirilov
发明人: Aleksandar Uzelac , David A. Stevens , Weidong Zhao , Takahiro Shigemitsu , Briggs A. Willoughby , John Graham Pierce , Pravin Kumar Santiago , Craig S. Ranta , Timothy Allen Wright , Jeffrey C. Maier , Robert T. Perry , Stanimir Naskov Kirilov
IPC分类号: G06F3/041
CPC分类号: G06F3/0418 , G06F3/044 , G06F11/2221
摘要: Touchscreen testing techniques are described. In one or more implementations, a piece of conductor (e.g., metal) is positioned as proximal to a touchscreen device and the touchscreen device is tested by simulating a touch of a user. This technique may be utilized to perform a variety of different testing of a touchscreen device, such as to test latency and probabilistic latency. Additional techniques are also described including contact geometry testing techniques.
摘要翻译: 描述了触摸屏测试技术。 在一个或多个实现中,一片导体(例如,金属)被定位成接近触摸屏设备,并且通过模拟用户的触摸来测试触摸屏设备。 该技术可以用于执行触摸屏设备的各种不同的测试,例如测试延迟和概率等待时间。 还描述了附加技术,包括接触几何测试技术。
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公开(公告)号:US20120206377A1
公开(公告)日:2012-08-16
申请号:US13099288
申请日:2011-05-02
申请人: Weidong Zhao , David A. Stevens , Aleksandar Uzelac , Takahiro Shigemitsu , Andrew David Wilson , Nigel Stuart Keam
发明人: Weidong Zhao , David A. Stevens , Aleksandar Uzelac , Takahiro Shigemitsu , Andrew David Wilson , Nigel Stuart Keam
IPC分类号: G06F3/041
CPC分类号: G06F3/041 , G06F3/0416 , G06F3/0488
摘要: In embodiments of angular contact geometry, touch input sensor data is recognized as a touch input on a touch-screen display, such as a touch-screen display integrated in a mobile phone or portable computing device. A sensor map is generated from the touch input sensor data, and the sensor map represents the touch input. The sensor map can be generated as a two-dimensional array of elements that correlate to sensed contact from a touch input. An ellipse can then be determined that approximately encompasses elements of the sensor map, and the ellipse represents a contact shape of the touch input.
摘要翻译: 在角接触几何的实施例中,触摸输入传感器数据被识别为触摸屏显示器上的触摸输入,诸如集成在移动电话或便携式计算设备中的触摸屏显示器。 从触摸输入传感器数据生成传感器图,传感器图表示触摸输入。 传感器图可以被生成为与来自触摸输入的感测到的接触相关联的元件的二维阵列。 然后可以确定大致包含传感器图的元素的椭圆,并且椭圆表示触摸输入的接触形状。
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公开(公告)号:US20120187956A1
公开(公告)日:2012-07-26
申请号:US13154161
申请日:2011-06-06
申请人: Aleksandar Uzelac , David A. Stevens , Weidong Zhao , Takahiro Shigemitsu , Briggs A. Willoughby , John Graham Pierce
发明人: Aleksandar Uzelac , David A. Stevens , Weidong Zhao , Takahiro Shigemitsu , Briggs A. Willoughby , John Graham Pierce
IPC分类号: G01R31/02
CPC分类号: G06F3/0418 , G01R31/28 , G01R31/2829 , G06F3/044 , G09G3/006
摘要: Touchscreen testing techniques are described. In one or more implementations, a conductor is placed proximal to a touchscreen device and the touchscreen device is tested by simulating a touch of a user by placing the conductor in a grounded state and lack of a touch by the user by placing the conductor in an ungrounded state.
摘要翻译: 描述了触摸屏测试技术。 在一个或多个实现中,导体放置在触摸屏设备的近侧,并且触摸屏设备通过将导体置于接地状态并通过将导体放置在接地状态中而不被触摸而模拟用户的触摸来测试 不接地状态
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公开(公告)号:US09965094B2
公开(公告)日:2018-05-08
申请号:US13198036
申请日:2011-08-04
申请人: Aleksandar Uzelac , David A. Stevens , Weidong Zhao , Takahiro Shigemitsu , Briggs A. Willoughby , John Graham Pierce , Pravin Kumar Santiago , Craig S. Ranta , Timothy Allen Wright , Jeffrey C. Maier , Robert T. Perry , Stanimir Naskov Kirilov
发明人: Aleksandar Uzelac , David A. Stevens , Weidong Zhao , Takahiro Shigemitsu , Briggs A. Willoughby , John Graham Pierce , Pravin Kumar Santiago , Craig S. Ranta , Timothy Allen Wright , Jeffrey C. Maier , Robert T. Perry , Stanimir Naskov Kirilov
CPC分类号: G06F3/0418 , G06F3/044 , G06F11/2221
摘要: Touchscreen testing techniques are described. In one or more implementations, a piece of conductor (e.g., metal) is positioned as proximal to a touchscreen device and the touchscreen device is tested by simulating a touch of a user. This technique may be utilized to perform a variety of different testing of a touchscreen device, such as to test latency and probabilistic latency. Additional techniques are also described including contact geometry testing techniques.
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公开(公告)号:US08988087B2
公开(公告)日:2015-03-24
申请号:US13154161
申请日:2011-06-06
申请人: Aleksandar Uzelac , David A. Stevens , Weidong Zhao , Takahiro Shigemitsu , Briggs A. Willoughby , John Graham Pierce
发明人: Aleksandar Uzelac , David A. Stevens , Weidong Zhao , Takahiro Shigemitsu , Briggs A. Willoughby , John Graham Pierce
CPC分类号: G06F3/0418 , G01R31/28 , G01R31/2829 , G06F3/044 , G09G3/006
摘要: Touchscreen testing techniques are described. In one or more implementations, a conductor is placed proximal to a touchscreen device and the touchscreen device is tested by simulating a touch of a user by placing the conductor in a grounded state and lack of a touch by the user by placing the conductor in an ungrounded state.
摘要翻译: 描述了触摸屏测试技术。 在一个或多个实现中,导体放置在触摸屏设备的近侧,并且触摸屏设备通过将导体置于接地状态并通过将导体放置在接地状态中而不被触摸而模拟用户的触摸来测试 不接地状态
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