公开(公告)号：US07866056B2

公开(公告)日：2011-01-11

申请号：US12449148

申请日：2008-02-18

Applicant: John Charles Ould ,  Alexander Tennant Sutherland

Inventor： John Charles Ould ,  Alexander Tennant Sutherland

IPC: G01B5/004 ,  G01D21/00

CPC classification number: G01B21/042

Abstract: A method is described for calibrating apparatus including a measurement probe mounted on a machine, such as a machine tool. The machine is arranged to capture machine position data indicative of the position of the measurement probe and the measurement probe is arranged to capture probe data indicative of the position of a surface relative to the measurement probe. The measurement probe may be an analogue or scanning probe having a deflectable stylus. The first step of the method involves moving the measurement probe at a known speed relative to an artefact whilst capturing probe data and machine position data. In particular, the measurement probe is moved along a path that enables probe data to be captured that is indicative of the position of two or more points on the surface of the artefact relative to the measurement probe. A second step of the method comprises analyzing the machine position data and the probe data and determining from that data the relative delay in capturing probe data and machine position data (i.e. the so-called system delay).

Abstract translation: 描述了一种用于校准装置的方法，该装置包括安装在诸如机床的机器上的测量探针。 机器被布置成捕获指示测量探针的位置的机器位置数据，并且测量探针被布置成捕获指示表面相对于测量探针的位置的探测数据。 测量探头可以是具有可偏转的触笔的模拟或扫描探针。 该方法的第一步包括以相对于人造物的已知速度移动测量探针，同时捕获探针数据和机器位置数据。 特别地，测量探针沿着使得能够捕获指示相对于测量探针的人造物表面上的两个或更多个点的位置的探针数据的路径移动。 该方法的第二步包括分析机器位置数据和探头数据，并根据该数据确定捕获探头数据和机器位置数据（即所谓的系统延迟）的相对延迟。

公开(公告)号：US06909983B2

公开(公告)日：2005-06-21

申请号：US10471403

申请日：2002-03-13

Applicant: Alexander Tennant Sutherland

Inventor： Alexander Tennant Sutherland

IPC: G01B21/00 ,  G01B21/04 ,  G01Q40/02 ,  G01Q70/00 ,  G01B5/00

CPC classification number: B82Y15/00 ,  G01B21/042

Abstract: A method of calibrating a probe mounted on a machine in which the probe has a probe calibration matrix which relates the probe outputs in three orthogonal axes to the machine's X, Y and Z coordinate system. A datum ball mounted on the machine is bi-directionally scanned by the probe in one or more planes. For each plane, the mean direction of two approximate probe vectors in the plane is rotated about an axis orthogonal to that plane until the apparent material condition from the scan in each direction is the same. This process may be iterative. The mean values of the directions of the probe vectors for each plane are rotated, thus forming a corrected probe calibration matrix. The datum ball is preferably bi-directionally scanned in three orthogonal planes.

Abstract translation: 一种校准安装在机器上的探针的方法，其中探头具有探针校准矩阵，其将三个正交轴中的探针输出与机器的X，Y和Z坐标系相关联。 安装在机器上的基准球由探头在一个或多个平面中双向扫描。 对于每个平面，平面中的两个近似探针矢量的平均方向围绕与该平面正交的轴线旋转，直到来自每个方向的扫描的表观材料状态相同。 这个过程可能是迭代的。 旋转每个平面的探针矢量的方向的平均值，从而形成校正的探针校准矩阵。 基准球优选在三个正交平面中双向扫描。

公开(公告)号：US20100018069A1

公开(公告)日：2010-01-28

申请号：US12449148

申请日：2008-02-18

Applicant: John Charles Ould ,  Alexander Tennant Sutherland

Inventor： John Charles Ould ,  Alexander Tennant Sutherland

IPC: G01B5/004 ,  G01B5/00

CPC classification number: G01B21/042

Abstract: A method is described for calibrating apparatus comprising a measurement probe (4) mounted on a machine, such as a machine tool. The machine is arranged to capture machine position data (x,y,z;70;80) indicative of the position of the measurement probe and the measurement probe is arranged to capture probe data (a,b,c;72;82) indicative of the position of a surface relative to the measurement probe (4). The measurement probe (4) may be an analogue or scanning probe having a deflectable stylus (14). The first step of the method involves moving the measurement probe (4) at a known speed relative to an artefact (30;40,42) whilst capturing probe data (a,b,c;72;82) and machine position data (x,y,z;70;80). In particular, the measurement probe (4) is moved along a path that enables probe data (a,b,c;72;82) to be captured that is indicative of the position of two or more points on the surface of the artefact relative to the measurement probe (4). A second step of the method comprises analysing the machine position data (x,y,z;70;80) and the probe data (a,b,c;72;82) and determining from that data the relative delay in capturing probe data and machine position data (i.e. the so-called system delay).

Abstract translation: 描述了一种用于校准装置的方法，该装置包括安装在诸如机床的机器上的测量探针（4）。 机器被布置成捕获指示测量探针的位置的机器位置数据（x，y，z; 70; 80），并且测量探针被布置成捕获指示性的探测数据（a，b，c; 72; 82） 的表面相对于测量探针（4）的位置。 测量探针（4）可以是具有偏转触笔（14）的模拟或扫描探针。 该方法的第一步包括以相对于人造物（30; 40,42）的已知速度移动测量探针（4），同时捕获探测数据（a，b，c; 72; 82）和机器位置数据（x ，y，z; 70; 80）。 特别地，测量探针（4）沿着允许探测数据（a，b，c; 72; 82）被捕获的路径移动，该路径指示在人造物相对表面上的两个或多个点的位置 到测量探头（4）。 该方法的第二步包括分析机器位置数据（x，y，z; 70; 80）和探测数据（a，b，c; 72; 82），并根据该数据确定捕获探测数据的相对延迟 和机器位置数据（即所谓的系统延迟）。

公开(公告)号：US07900367B2

公开(公告)日：2011-03-08

申请号：US12225822

申请日：2007-04-24

Applicant: Alexander Tennant Sutherland

Inventor： Alexander Tennant Sutherland

IPC: G01B1/00 ,  G01B5/004 ,  G01B21/04

CPC classification number: G01B21/042

Abstract: A method of calibrating a measurement probe (10) mounted on a machine is described. The measurement probe (10) has a stylus (14) with a workpiece contacting tip (16). The method comprises determining a probe calibration matrix that relates the probe outputs (a,b,c) to the machine coordinate system (x,y,z.). The method comprising the steps of scanning a calibration artefact (18) using a first probe deflection (d1) to obtain first machine data and using a second probe deflection (d2) to obtain second machine data. The first and second machine data are used to obtain a pure probe calibration matrix in which any machine errors are substantially omitted. Advantageously, the method determines the pure probe matrix numerically based on the assumption that the difference between the first and second machine position data is known.

Abstract translation: 描述了一种校准安装在机器上的测量探针（10）的方法。 测量探头（10）具有带有工件接触尖端（16）的触针（14）。 该方法包括确定将探针输出（a，b，c）与机器坐标系（x，y，z）相关联的探针校准矩阵。 该方法包括以下步骤：使用第一探针偏转（d1）扫描校准伪影（18）以获得第一机器数据并使用第二探针偏转（d2）来获得第二机器数据。 第一和第二机器数据用于获得基本上省略任何机器错误的纯探针校准矩阵。 有利地，该方法基于第一和第二机器位置数据之间的差已知的假设，以数字方式确定纯探针矩阵。

公开(公告)号：US20090307915A1

公开(公告)日：2009-12-17

申请号：US12225822

申请日：2007-04-24

Applicant: Alexander Tennant Sutherland

Inventor： Alexander Tennant Sutherland

IPC: G01B21/04 ,  G01B5/004

CPC classification number: G01B21/042

Abstract: A method of calibrating a measurement probe (10) mounted on a machine is described. The measurement probe (10) has a stylus (14) with a workpiece contacting tip (16). The method comprises determining a probe calibration matrix that relates the probe outputs (a,b,c) to the machine coordinate system (x,y,z.). The method comprising the steps of scanning a calibration artefact (18) using a first probe deflection (d1) to obtain first machine data and using a second probe deflection (d2) to obtain second machine data. The first and second machine data are used to obtain a pure probe calibration matrix in which any machine errors are substantially omitted. Advantageously, the method determines the pure probe matrix numerically based on the assumption that the difference between the first and second machine position data is known.

Abstract translation: 描述了一种校准安装在机器上的测量探针（10）的方法。 测量探头（10）具有带有工件接触尖端（16）的触针（14）。 该方法包括确定将探针输出（a，b，c）与机器坐标系（x，y，z）相关联的探针校准矩阵。 该方法包括以下步骤：使用第一探针偏转（d1）扫描校准伪影（18）以获得第一机器数据并使用第二探针偏转（d2）来获得第二机器数据。 第一和第二机器数据用于获得基本上省略任何机器错误的纯探针校准矩阵。 有利地，该方法基于第一和第二机器位置数据之间的差已知的假设，以数字方式确定纯探针矩阵。

公开(公告)号：US06810597B2

公开(公告)日：2004-11-02

申请号：US10632868

申请日：2003-08-04

Applicant: Jean-Louis Grzesiak ,  Alexander Tennant Sutherland

Inventor： Jean-Louis Grzesiak ,  Alexander Tennant Sutherland

IPC: G01B5004

CPC classification number: B82Y15/00 ,  G01B21/042

Abstract: A method of measuring an artefact 5 using a machine 2 on which a measuring probe 6 is mounted. The probe is brought into contact with the artefact and movement continued for a limited distance to deflect the stylus 7. The machine and probe outputs are recorded whilst the probe is free and when the stylus is deflected. A model of the probe and CMM outputs during both contact and non-contact between the probe and artefact is fitted to the data to allow the contact position when the stylus contacts the artefact with zero force to be determined. The probe outputs may be fitted to the model individually to determine a single contact position. By using data during movement of the probe towards and away from the artefact, errors due to time delays may be corrected.

Abstract translation: 使用其上安装有测量探针6的机器2来测量人造物5的方法。 使探针与伪影接触，并且移动持续一段有限的距离以使触针7偏转。当探针自由并且当触针偏转时，记录机器和探头输出。 在探针和伪影之间的接触和非接触期间，探头和CMM输出的模型被拟合到数据中，以便当触针以零力接触人造物以确定接触位置时。 探头输出可以单独安装到模型上，以确定单个接触位置。 通过在探针移动和远离伪影的过程中使用数据，可能会纠正由于时间延迟引起的错误。