公开(公告)号：US10692362B2

公开(公告)日：2020-06-23

申请号：US16516600

申请日：2019-07-19

Applicant: Allegro MicroSystems, LLC

Inventor： Craig S. Petrie ,  Akshay Pai ,  David J. Haas

IPC: G06F11/00 ,  G08B29/14 ,  G01D3/08 ,  G01R31/28 ,  G08B21/18 ,  G01R33/00

Abstract: A sensor integrated circuit includes a main processing channel that responds to an input signal by generating a first processed signal from the input signal. Also included is a diagnostic processing channel that responds to the input signal by generating a second processed signal from the input signal. The main processing channel has a first response to disturbances and the diagnostic processing channel has a second response to disturbances that is slower than the first response of the main processing channel. A checker circuit in the sensor integrated circuit detects faults in the sensor IC and generates a fault signal when the first processed signal and the second processed signal differ from each other by more than a threshold amount.

公开(公告)号：US20190362619A1

公开(公告)日：2019-11-28

申请号：US16516600

申请日：2019-07-19

Applicant: Allegro MicroSystems, LLC

Inventor： Craig S. Petrie ,  Akshay Pai ,  David J. Haas

IPC: G08B29/14 ,  G01D3/08 ,  G01R33/00 ,  G08B21/18 ,  G01R31/28

Abstract: A sensor integrated circuit includes a main processing channel that responds to an input signal by generating a first processed signal from the input signal. Also included is a diagnostic processing channel that responds to the input signal by generating a second processed signal from the input signal. The main processing channel has a first response to disturbances and the diagnostic processing channel has a second response to disturbances that is slower than the first response of the main processing channel. A checker circuit in the sensor integrated circuit detects faults in the sensor IC and generates a fault signal when the first processed signal and the second processed signal differ from each other by more than a threshold amount.