公开(公告)号：US11585868B2

公开(公告)日：2023-02-21

申请号：US16994864

申请日：2020-08-17

Applicant: Allegro MicroSystems, LLC

Inventor： P. Karl Scheller ,  James E. Burgess ,  Steven E. Snyder ,  Kristann L. Moody ,  Devon Fernandez ,  Andrea Foletto

IPC: G01R33/06 ,  G01R33/00 ,  G01D5/244 ,  G01P3/487 ,  G01P3/488 ,  G01P21/02 ,  G01R23/00 ,  G01P3/44 ,  G01P13/00

Abstract: Systems, methods, and apparatuses for magnetic field sensors with self-test include a detection circuit to detect speed and direction of a target. One or more circuits to test accuracy of the detected speed and direction may be included. One or more circuits to test accuracy of an oscillator may also be included. One or more circuits to test the accuracy of an analog-to-digital converter may also be included. Additionally, one or more IDDQ and/or built-in-self test (BIST) circuits may be included.

公开(公告)号：US20160025820A1

公开(公告)日：2016-01-28

申请号：US14337613

申请日：2014-07-22

Applicant: Allegro MicroSystems, LLC

Inventor： P. Karl Scheller ,  James E. Burgess ,  Steven E. Snyder ,  Kristann L. Moody ,  Devon Fernandez ,  Andrea Foletto

IPC: G01R33/00 ,  G01P3/44 ,  G01P13/00 ,  G01R33/06

CPC classification number: G01R33/0023 ,  G01D5/24476 ,  G01P3/44 ,  G01P3/487 ,  G01P3/488 ,  G01P13/00 ,  G01P21/02 ,  G01R23/005 ,  G01R33/06

Abstract: Systems, methods, and apparatuses for magnetic field sensors with self-test include a detection circuit to detect speed and direction of a target. One or more circuits to test accuracy of the detected speed and direction may be included. One or more circuits to test accuracy of an oscillator may also be included. One or more circuits to test the accuracy of an analog-to-digital converter may also be included. Additionally, one or more IDDQ and/or built-in-self test (BIST) circuits may be included.

Abstract translation: 具有自检功能的磁场传感器的系统，方法和装置包括检测目标的速度和方向的检测电路。 可以包括用于测试检测到的速度和方向的精度的一个或多个电路。 还可以包括用于测试振荡器精度的一个或多个电路。 还可以包括用于测试模拟 - 数字转换器的精度的一个或多个电路。 此外，可以包括一个或多个IDDQ和/或内置自检（BIST）电路。

公开(公告)号：US20180088184A1

公开(公告)日：2018-03-29

申请号：US15816045

申请日：2017-11-17

Applicant: Allegro MicroSystems, LLC

Inventor： P. Karl Scheller ,  James E. Burgess ,  Steven E. Snyder ,  Kristann L. Moody ,  Devon Fernandez ,  Andrea Foletto

IPC: G01R33/00 ,  G01D5/244 ,  G01R23/00 ,  G01P21/02 ,  G01P3/488 ,  G01P3/44 ,  G01R33/06 ,  G01P13/00 ,  G01P3/487

Abstract: Systems, methods, and apparatuses for magnetic field sensors with self-test include a detection circuit to detect speed and direction of a target. One or more circuits to test accuracy of the detected speed and direction may be included. One or more circuits to test accuracy of an oscillator may also be included. One or more circuits to test the accuracy of an analog-to-digital converter may also be included. Additionally, one or more IDDQ and/or built-in-self test (BIST) circuits may be included.

公开(公告)号：US10782363B2

公开(公告)日：2020-09-22

申请号：US15816045

申请日：2017-11-17

Applicant: Allegro MicroSystems, LLC

Inventor： P. Karl Scheller ,  James E. Burgess ,  Steven E. Snyder ,  Kristann L. Moody ,  Devon Fernandez ,  Andrea Foletto

IPC: G01R33/00 ,  G01D5/244 ,  G01P3/487 ,  G01P3/488 ,  G01P21/02 ,  G01R23/00 ,  G01P3/44 ,  G01P13/00 ,  G01R33/06

Abstract: Systems, methods, and apparatuses for magnetic field sensors with self-test include a detection circuit to detect speed and direction of a target. One or more circuits to test accuracy of the detected speed and direction may be included. One or more circuits to test accuracy of an oscillator may also be included. One or more circuits to test the accuracy of an analog-to-digital converter may also be included. Additionally, one or more IDDQ and/or built-in-self test (BIST) circuits may be included.

公开(公告)号：US20200379061A1

公开(公告)日：2020-12-03

申请号：US16994864

申请日：2020-08-17

Applicant: Allegro MicroSystems, LLC

Inventor： P. Karl Scheller ,  James E. Burgess ,  Steven E. Snyder ,  Kristann L. Moody ,  Devon Fernandez ,  Andrea Foletto

IPC: G01R33/00 ,  G01D5/244 ,  G01P3/487 ,  G01P3/488 ,  G01P21/02 ,  G01R23/00 ,  G01P3/44 ,  G01P13/00 ,  G01R33/06

Abstract: Systems, methods, and apparatuses for magnetic field sensors with self-test include a detection circuit to detect speed and direction of a target. One or more circuits to test accuracy of the detected speed and direction may be included. One or more circuits to test accuracy of an oscillator may also be included. One or more circuits to test the accuracy of an analog-to-digital converter may also be included. Additionally, one or more IDDQ and/or built-in-self test (BIST) circuits may be included.