Abstract:
Apparatus and methods for chopper amplifiers are provided herein. In certain configurations, a chopper amplifier includes at least one differential transistor bank including a selection circuit and a plurality of transistors. The selection circuit can select a first portion of the transistors for operation in a first transistor group and a second portion of the transistors for operation in a second transistor group. During calibration, the chopper amplifier's input offset can be observed for different transistor configurations of the differential transistor banks. Although the transistors of a particular bank can be designed to have about the same drive-strength and/or geometry, the chopper amplifier can have a different input offset in different transistor configurations due to manufacturing mismatch between transistors, such as process variation. The chopper amplifier can be programmed to operate with the selected transistor configurations of the differential transistor banks to provide the amplifier with low input offset.
Abstract:
Apparatus and methods for reducing charge injection mismatch are provided herein. In certain implementations, an electronic circuit includes one or more switch banks. Each switch bank can include a selection circuit and a plurality of switches that can be controlled using one or more clock signals. The selection circuit can select a first portion of the switches for operation in a first switch group and a second portion of the switches for operation in a second switch group. During a calibration, the electronic circuit's charge injection mismatch can be directly or indirectly observed for different switch configurations of the switch banks. The electronic circuit can be programmed to operate with the selected switch configurations of the switch banks to provide the electronic circuit with small charge injection mismatch.
Abstract:
Apparatus and methods for chopper amplifiers are provided herein. In certain configurations, a chopper amplifier includes at least one differential transistor bank including a selection circuit and a plurality of transistors. The selection circuit can select a first portion of the transistors for operation in a first transistor group and a second portion of the transistors for operation in a second transistor group. During calibration, the chopper amplifier's input offset can be observed for different transistor configurations of the differential transistor banks. Although the transistors of a particular bank can be designed to have about the same drive-strength and/or geometry, the chopper amplifier can have a different input offset in different transistor configurations due to manufacturing mismatch between transistors, such as process variation. The chopper amplifier can be programmed to operate with the selected transistor configurations of the differential transistor banks to provide the amplifier with low input offset.
Abstract:
Apparatus and methods for reducing charge injection mismatch are provided herein. In certain implementations, an electronic circuit includes one or more switch banks. Each switch bank can include a selection circuit and a plurality of switches that can be controlled using one or more clock signals. The selection circuit can select a first portion of the switches for operation in a first switch group and a second portion of the switches for operation in a second switch group. During a calibration, the electronic circuit's charge injection mismatch can be directly or indirectly observed for different switch configurations of the switch banks. The electronic circuit can be programmed to operate with the selected switch configurations of the switch banks to provide the electronic circuit with small charge injection mismatch.